2015
DOI: 10.1155/2015/418024
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The Influence of Thermal Conditions on V2O5 Nanostructures Prepared by Sol‐Gel Method

Abstract: This work presents the result of structure investigations of V2O5nanorods grown from thin films and powders prepared by sol-gel method. To examine the best temperature of nanorods crystallization, thin films deposited by spin-coating method on quartz glass or silicon substrates and bulk xerogel powders were annealed at various temperatures ranging from 100°C to 600°C. The structure of the samples was characterized by X-ray diffraction method (XRD), scanning electron microscope (SEM), differential scanning calo… Show more

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Cited by 32 publications
(21 citation statements)
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“…X‐ray diffraction patterns of V 2 O 5 nanoparticles (different molar concentrations‐ 0.05, 0.1, 0.15, and 0.2) with and without PVP are shown in Figure (a and b). From Figure , it is clear that the diffraction peaks of samples match very well with the JCPDS Card number 41–1426, which corresponds to the orthorhombic structure of V 2 O 5 with a space group of Pmmn (number 59) . It is evident that α‐V 2 O 5 is the only crystalline phase present in the samples.…”
Section: Resultssupporting
confidence: 57%
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“…X‐ray diffraction patterns of V 2 O 5 nanoparticles (different molar concentrations‐ 0.05, 0.1, 0.15, and 0.2) with and without PVP are shown in Figure (a and b). From Figure , it is clear that the diffraction peaks of samples match very well with the JCPDS Card number 41–1426, which corresponds to the orthorhombic structure of V 2 O 5 with a space group of Pmmn (number 59) . It is evident that α‐V 2 O 5 is the only crystalline phase present in the samples.…”
Section: Resultssupporting
confidence: 57%
“…From Figure 3, it is clear that the diffraction peaks of samples match very well with the JCPDS Card number 41-1426, which corresponds to the orthorhombic structure of V 2 O 5 with a space group of Pmmn (number 59). [32] It is evident that α-V 2 O 5 is the only crystalline phase present in the samples. No other secondary peaks related to other phases and impurities within the detection limit of XRD were observed.…”
Section: X-ray Diffraction (Xrd) Analysismentioning
confidence: 92%
“…[ 27 ] The spin‐coated V 2 O 5 films exhibited the β‐V 2 O 5 phase at 480 °C annealing temperature. [ 28 ] Furthermore, the annealing temperature‐induced increase in peak intensity revealed the enhancement in crystallization of the films.…”
Section: Resultsmentioning
confidence: 99%
“…Our observation is consistent with the literature reports. [26][27][28] For instance, Okimura et al have prepared V 2 O 3 film by reactive magnetron sputtering technique at the substrate temperature of 400 C and further annealing the films up to 650 C leads to the formation of different crystalline phases such as VO 2 , V 2 O 5 and V 3 O 7 , and pure V 2 O 5 . [26] In addition, Poelman et al have deposited V 2 O 5 film by direct current magnetron sputtering technique using V 2 O 3 as a sputtering target material and obtained the amorphous and polycrystalline forms of V 2 O 5 at the annealing temperatures of 200 and 500 C, respectively.…”
Section: Structural Propertiesmentioning
confidence: 99%
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