2023 24th International Conference on Electronic Packaging Technology (ICEPT) 2023
DOI: 10.1109/icept59018.2023.10491949
|View full text |Cite
|
Sign up to set email alerts
|

The Influence of Total Dose Irradiation and Annealing Experiments on Three Types of SiC Power Devices

Jie Jiang,
Shengdong Hu,
Yijun Shi
et al.
Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...

Citation Types

0
0
0

Publication Types

Select...

Relationship

0
0

Authors

Journals

citations
Cited by 0 publications
references
References 33 publications
0
0
0
Order By: Relevance

No citations

Set email alert for when this publication receives citations?