The Leipzig high-energy ion nanoprobe: A report on first results

Butz, T.; Flagmeyer, R.; Heitmann, Johannes; Jamieson, David N.; Legge, G.J.F.; Lehmann, D.; Reibetanz, Uta; Reinert, Tilo; Saint, A.; Spemann, D.; Szymanski, R.; Tröger, W.; Vogt, J.; Zhu, J.

doi:10.1016/s0168-583x(99)00898-8

Cited by 55 publications

(13 citation statements)

References 2 publications

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“…Metal Analysis-The metal content of isolated PWA was determined by detection of the proton-induced x-ray emission (PIXE) at the Leipzig 2 MeV proton microprobe (17). Using this technique, all elements besides those lighter than sodium can be detected in a single scan at a minimum weight limit of ϳ1-10 ppm.…”

Section: Methodsmentioning

confidence: 99%

Differential Regulation of a Hyperthermophilic α-Amylase with a Novel (Ca,Zn) Two-metal Center by Zinc

Lindén

Mayans

Meyer‐Klaucke

et al. 2003

Journal of Biological Chemistry

102

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The crystal structure of the ␣-amylase from the hyperthermophilic archaeon Pyrococcus woesei was solved in the presence of three inhibitors: acarbose, Tris, and zinc. In the absence of exogenous metals, this ␣-amylase bound 1 and 4 molar eq of zinc and calcium, respectively. The structure reveals a novel, activating, twometal (Ca,Zn)-binding site and a second inhibitory zincbinding site that is found in the ؊1 sugar-binding pocket within the active site. The data resolve the apparent paradox between the zinc requirement for catalytic activity and its strong inhibitory effect when added in molar excess. They provide a rationale as to why this ␣-amylase, in contrast to commercially available ␣-amylases, does not require the addition of metal ions for full catalytic activity, suggesting it as an ideal target to maximize the efficiency of industrial processes like liquefaction of starch.

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Section: Methodsmentioning

confidence: 99%

Differential Regulation of a Hyperthermophilic α-Amylase with a Novel (Ca,Zn) Two-metal Center by Zinc

Lindén

Mayans

Meyer‐Klaucke

et al. 2003

Journal of Biological Chemistry

102

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“…can be created. For an element-sensitive analysis using PIXE a lateral resolution of 300 nm has been obtained [8]. Since sputtering effects can be neglected when using MeV light ions the analysis can be considered as non-destructive.…”

Section: Methodsmentioning

confidence: 99%

Non-destructive 3D-characterization of Zn 2-2x Cu x In x S 2 -thin films with ion beam analysis

Spemann

Vogt

Butz

et al. 2002

Analytical and Bioanalytical Chemistry

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Thin layers of ZnS-CuInS(2) mixed crystals (called ZCIS) are promising absorber materials for thin film solar cell applications. The ZCIS-films investigated in this study were grown on (001)GaP, SiO(2) and CeO(2)/Al(2)O(3) with different elemental compositions by Pulsed Laser Deposition (PLD). In order to optimize the sample preparation process a quantitative three-dimensional (i.e. laterally and depth resolved) determination of the compositions and thicknesses of the ZCIS-films is needed. It is demonstrated how this difficult analytical task can be addressed with ion microbeam analysis. For this purpose the films have been analysed non-destructively by means of Rutherford Backscattering Spectrometry (RBS) and Particle Induced X-ray Emission (PIXE) using a 2 MeV He(+) ion microbeam at the high-energy ion nanoprobe LIPSION. A large variation in film thickness caused by particulates deposited on the film was observed. The elemental compositions of the film and the particulates have been determined and compared with the target composition. The deviations found varied substantially for the individual elements. It could be concluded from these measurements, that the quality of the sintered PLD-target is of crucial importance for the roughness of the films. Furthermore concentration-depth-profiles of the individual elements have been derived non-destructively by means of RBS.

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“…[6,7]) and several groups are working on the design of the next generation of quadrupole focusing systems (e.g. [8][9][10]), often involving high demagnification multiple stage lenses.…”

Section: Focusing Mev Ions To Sub-micron Dimensionsmentioning

confidence: 99%

Materials Patterning and Characterisation at the Nanometre Scale Using Focused MeV Ion Beams: Present Achievements and Future Prospects

Grime

2009

Acta Phys. Pol. A

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A key phenomenon in the interaction of MeV ions and solids is that the energy transferred from the primary ions to the target electrons is high compared with atomic and molecular binding energies, but low compared with the ion energy. This means that there is a high probability of modifying the chemical properties of the material (for patterning) or of inducing the emission of electromagnetic radiation (for analysis), yet the path of particle is changed by a negligible amount, which means that focused beams remain sharp even after penetrating long depths into the material. Developments in focusing MeV ions in recent years have pushed the useable beam diameters into the sub-micrometre region, which means that nuclear microbeams are poised to make an impact in both direct write fabrication and micro-analysis at length scales of interest in nanotechnology or microbiology. This paper reviews the science and technology underlying the use of nuclear microbeams (ion solid interactions, focusing systems) and reports on the present status and trends of applications in sub-micron scale applications. Interactions between MeV ions and atoms: the key advantage of MeV ions in nanoscale applicationsMeV ions interact with the atoms of target materials through electrostatic forces between the charged electrons and nuclei of the atoms. Apart from a small fraction of ions which undergo large angle scattering resulting from a close approach to the nucleus (the Rutherford scattering), the primary effect of the interaction is to create a transient electric dipole excitation of the electron structure of the atom. Kinetic energy is absorbed from the ion and may result in ionisation or promoting one or more of the atomic electrons into excited states.The energy transferred from the ion to the atom depends on many factors, but can range from zero to a few tens of keV. This is large compared with electronic binding energies (especially those of valence electrons), giving a high probability of locally modifying the chemistry of the sample, but small compared with the primary ion energy, so that the ion is not strongly deflected or decelerated, and can undergo many thousands of atomic collisions while following an essentially straight path for a large part of its range. This is the unique advantage of MeV ions for high spatial resolution applications: there is a high probability of creating useful effects in the material, yet the primary ion has a long range and a straight path with low lateral scattering. This is demonstrated in Fig.

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The Leipzig high-energy ion nanoprobe: A report on first results

Cited by 55 publications

References 2 publications

Differential Regulation of a Hyperthermophilic α-Amylase with a Novel (Ca,Zn) Two-metal Center by Zinc

Differential Regulation of a Hyperthermophilic α-Amylase with a Novel (Ca,Zn) Two-metal Center by Zinc

Non-destructive 3D-characterization of Zn 2-2x Cu x In x S 2 -thin films with ion beam analysis

Materials Patterning and Characterisation at the Nanometre Scale Using Focused MeV Ion Beams: Present Achievements and Future Prospects

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