The limiting factor for oxygen exchange at the surface of fuel cell electrolytes

Ridder, de M Marco; Vervoort, Agj Twan; Welzenis, van Rg Robert; Brongersma, H.H.

doi:10.1016/s0167-2738(02)00754-3

Cited by 101 publications

(89 citation statements)

References 22 publications

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“…A significant increase of 18 O/ 16 O exchange rate is observed upon the presence of an oxygen plasma. 2.…”

Section: Discussionmentioning

confidence: 94%

“…The second and often applied method is impedance spectroscopy, which offers valuable information on boundary resistances and capacities [4]. Furthermore 18 O/ 16 O isotope exchange experiments are also used for the quantification of the exchange kinetics [5,6]. More recently Merkle et al investigated the oxygen incorporation kinetics of Fe-doped SrTiO 3 in stoichiometry relaxation experiments using UVVis spectroscopy.…”

Section: Introductionmentioning

confidence: 99%

“…He analysed 18 O/ 16 O exchange experiments via two different techniques: He analysed the concentration profile of 18 O in YSZ and also determined the composition of the gas phase during the exchange experiment. Below this temperature there must be also other slow kinetic steps, as in the gas phase analysis he detected a large amount of 16 O 18 O species.…”

Section: Introductionmentioning

confidence: 99%

“…Recently De Ridder published careful experimental studies of the influence of surface segregation effects on the exchange kinetics of YSZ and of surface cleaning procedures (mainly polycrystaline specimens) [16]. He measured a pronounced difference in the reactivity of clean YSZ surfaces and surfaces with segregated impurities.…”

Section: Introductionmentioning

confidence: 99%

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Surface oxygen exchange between yttria-stabilised zirconia and a low-temperature oxygen rf-plasma

et al. 2004

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Isotope Exchange/Depth Profiling (IEDP) using Secondary Ion Mass Spectrometry (SIMS) has been used to determine the oxygen tracer diffusion and surface exchange coefficients of (100) oriented 9.5 mol% yttria stabilised zirconia single crystals. Exchange experiments performed with molecular oxygen are compared with the exchange using an oxygen plasma. The surface exchange coefficient for specimens in a plasma is up to 100 times higher compared to measurements with normal molecular oxygen. For the exchange experiments we used an inductively coupled radio frequency (rf) oxygen plasma with a maximum radio frequency power of 250 W. Double probe measurements and optical emission spectrometry are used for the characterisation of the plasma. The measured electron temperatures are within the range of 5 -12 eV. D

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“…A significant increase of 18 O/ 16 O exchange rate is observed upon the presence of an oxygen plasma. 2.…”

Section: Discussionmentioning

confidence: 94%

Section: Introductionmentioning

confidence: 99%

Section: Introductionmentioning

confidence: 99%

Section: Introductionmentioning

confidence: 99%

See 2 more Smart Citations

Surface oxygen exchange between yttria-stabilised zirconia and a low-temperature oxygen rf-plasma

et al. 2004

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“…It has been applied for the study of different processes in which the outermost atomic layer drastically affects the material functionality, such as catalysts, semiconductors, electronics, and solid oxide fuel cells. [1][2][3][4][5] The capability of LEIS to selectively probe the first monoatomic surface relies on the very effective neutralization of the noble gas ions being scattered from inner layers, which assures that the signal originates from the outermost surface since only scattered ions are detected. 6 This surface sensitivity represents the main advantage of LEIS over other surface analysis techniques (e.g., secondary ion mass spectrometry (SIMS), x-ray photoelectron spectroscopy (XPS), or Auger electron spectroscopy (AES)) where the information comes from the first 3 to 20 atomic layers (depth of about 1-10 nm).…”

Section: Low-energy Ion Scattering (Leis) Is a Very Powerfulmentioning

confidence: 99%

Determination of 16O and 18O sensitivity factors and charge-exchange processes in low-energy ion scattering

Téllez

Chater

Fearn

et al. 2012

Applied Physics Letters

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Quantitative analysis in low-energy ion scattering (LEIS) requires an understanding of the charge-exchange processes to estimate the elemental sensitivity factors. In this work, the neutralization of He+ scattered by 18O-exchanged silica at energies between 0.6 and 7 keV was studied. The process is dominated by Auger neutralization for Ei < 0.8 keV. An additional mechanism starts above the reionization threshold. This collision-induced neutralization becomes the dominant mechanism for Ei > 2 keV. The ion fractions P+ were determined for Si and O using the characteristic velocity method to quantify the surface density. The 18O/16O sensitivity ratio indicates an 18% higher sensitivity for the heavier O isotope.

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Low‐Energy Ion Scattering

Brongersma¹

2012

Characterization of Materials

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Low‐energy ion scattering (LEIS), also called ion scattering spectroscopy (ISS), is a tool for the analysis of the atomic composition of the surface as well as for a nondestructive in‐depth analysis of the near surface (0–10 nm). The analysis is based on backscattering of noble gas ions (He + , Ne + , Ar + , or Kr + ) in the range of a few hundred to 10,000 eV. The extreme surface sensitivity of LEIS enables the selective analysis of the outermost atomic layer. This is precisely the layer that is largely responsible for many chemical and physical properties of materials. In combination with sputter depth profiling LEIS can also be used for the analysis of much deeper layers. Recent advances in the development of LEIS instruments now allow an essentially nondestructive (“static”) analysis, even of very sensitive materials like organic films. With the modern LEIS instruments one can analyze very rough amorphous insulating samples just as easily as conducting flat single crystals. The only restriction for samples being, that they can be put into vacuum for analysis. The applications of LEIS are, therefore, very wide and include important processes like adhesion, catalysis, diffusion, film growth, and electron emission. Alternative techniques include surface science tools, in particular X‐ray photoelectron spectroscopy (XPS), (TOF‐) SIMS, the high‐energy ion scattering techniques (HEIS), and medium‐energy ion scattering, MEIS.

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The limiting factor for oxygen exchange at the surface of fuel cell electrolytes

Cited by 101 publications

References 22 publications

Surface oxygen exchange between yttria-stabilised zirconia and a low-temperature oxygen rf-plasma

Surface oxygen exchange between yttria-stabilised zirconia and a low-temperature oxygen rf-plasma

Determination of 16O and 18O sensitivity factors and charge-exchange processes in low-energy ion scattering

Low‐Energy Ion Scattering

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