2007
DOI: 10.1016/j.jmmm.2007.03.185
|View full text |Cite
|
Sign up to set email alerts
|

The lock-in technique for studying magnetoelectric effect

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
2
1
1

Citation Types

4
75
0
2

Year Published

2010
2010
2024
2024

Publication Types

Select...
9
1

Relationship

1
9

Authors

Journals

citations
Cited by 169 publications
(93 citation statements)
references
References 9 publications
4
75
0
2
Order By: Relevance
“…All the magnetoelectric measurements were performed using the dynamic lock-in method described in detail in [16]. The essence of this method is to measure AC voltage V out induced between surfaces of the sample as a result of applying a small AC magnetic eld (H AC H DC ).…”
Section: Methodsmentioning
confidence: 99%
“…All the magnetoelectric measurements were performed using the dynamic lock-in method described in detail in [16]. The essence of this method is to measure AC voltage V out induced between surfaces of the sample as a result of applying a small AC magnetic eld (H AC H DC ).…”
Section: Methodsmentioning
confidence: 99%
“…The direction of the applied magnetic field was parallel to the layers. The magnetoelectric effect was evaluated at room temperature by dynamic lock-in method, which has been described previously in the literature [12]. The induced voltage between sample surfaces was measured with a lock-in amplifier (Stanford Research System, model SR 830) with input resistance of 100 MΩ and a capacitance of 25 pF.…”
Section: Methodsmentioning
confidence: 99%
“…Therefore, the ME effect was characterized by measuring the longitudinal ME voltage coefficient a ME using the dynamic lock-in amplifier method. 11 A pair of Helmholtz coils was used to generate an AC magnetic field with amplitude of 3 Oe and frequency of 300 Hz that is superimposed to a DC bias field driven by an electromagnet. Both fields are applied in-plane of the nanocomposite film and the generated small signal voltage across the sample thickness is measured using a digital Lock-in amplifier (Stanford Research SR850).…”
Section: B Ferroelectric and Magnetoelectric Characterizationmentioning
confidence: 99%