2019 Latin American Electron Devices Conference (LAEDC) 2019
DOI: 10.1109/laed.2019.8714740
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The magnetic field impact on the 1/f noise and the charge-pumping measurements in MOSFETs

Oscar Huerta
1
,
Adrian I. Tec-Chim
2
,
Edmundo A. Gutierrez-D
3
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