2010
DOI: 10.1002/adma.201000892
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The Materials Challenge in Diffraction‐Unlimited Direct‐Laser‐Writing Optical Lithography

Abstract: Using a novel photoresist (composed of pentaerythritol triacrylate and isopropyl thioxanthone) that favors stimulated emission depletion by a π‐π* transition and using a two‐color two‐photon excitation scheme, 65‐nm wide lines are achieved. This value is limited by parasitic two‐photon absorption of the continuous‐wave depletion beam. It is estimated that, without this process, line widths of 30 nm are in reach.

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Cited by 236 publications
(197 citation statements)
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“…[1][2][3][4] Developments of new materials and illumination concepts like the STED lithography [5][6][7] have pushed the lateral dimensions of realizable structures below 100 nm. With the variability of the technology, several applications have emerged, e.g., in the field of micro-optics, where the fabrication of photonic crystals 8,9 or micro-optical elements [10][11][12][13] has been demonstrated.…”
Section: Introductionmentioning
confidence: 99%
“…[1][2][3][4] Developments of new materials and illumination concepts like the STED lithography [5][6][7] have pushed the lateral dimensions of realizable structures below 100 nm. With the variability of the technology, several applications have emerged, e.g., in the field of micro-optics, where the fabrication of photonic crystals 8,9 or micro-optical elements [10][11][12][13] has been demonstrated.…”
Section: Introductionmentioning
confidence: 99%
“…Therefore only weak fluorescence would be expected. Surprisingly, ITX exhibits a fluorescence quantum yield of 15 % [10]. Thus, any other channel competing for S 1 population has to be rather inefficient.…”
Section: -P2mentioning
confidence: 99%
“…In 3DLL a well chosen photoinitiator (PI) can improve fabrication throughput and structure qualities for a material used [6,7,[19][20][21]. The set of fabrication parameters needed for structuring material is generally refereed as fabrication window.…”
Section: Comparison Of Structuring Propertiesmentioning
confidence: 99%