2020
DOI: 10.1016/j.vacuum.2020.109192
|View full text |Cite
|
Sign up to set email alerts
|

The mechanism of elastic and electronic properties of Tungsten Silicide (5/3) with vacancy defect from the first-principles calculations

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
2
2

Citation Types

0
4
0

Year Published

2020
2020
2022
2022

Publication Types

Select...
6

Relationship

0
6

Authors

Journals

citations
Cited by 20 publications
(4 citation statements)
references
References 61 publications
0
4
0
Order By: Relevance
“…Therefore, it is necessary to study the structural stability of the doped system 58,59 . Here, the structural stability of the H‐doped FeS 2 is calculated by the doped formation of energy (E f ) 60‐63 : Ef=EFeS2HEitalicFeS212EH2 where EFeS2H and E FeS 2 are the calculated total energy of the hydrogenated FeS 2 and FeS 2 . E H 2 is the total energy of hydrogen molecule (H 2 ).…”
Section: Resultsmentioning
confidence: 99%
“…Therefore, it is necessary to study the structural stability of the doped system 58,59 . Here, the structural stability of the H‐doped FeS 2 is calculated by the doped formation of energy (E f ) 60‐63 : Ef=EFeS2HEitalicFeS212EH2 where EFeS2H and E FeS 2 are the calculated total energy of the hydrogenated FeS 2 and FeS 2 . E H 2 is the total energy of hydrogen molecule (H 2 ).…”
Section: Resultsmentioning
confidence: 99%
“…Generally, the mechanical properties of an ultrahigh-temperature solid include: elastic modulus and Vickers hardness. , The elastic modulus of CrSi 2 is examined using the bulk modulus ( B ), shear modulus ( G ), and Young’s modulus ( E ) . Here, the calculation methods of elastic modulus and mechanical stability of CrSi 2 are based on those reported by Zhang and Pan. …”
Section: Resultsmentioning
confidence: 99%
“…Naturally, the overall properties of a semiconductor are markedly influenced by the defect. [30][31][32][33][34] To solve the problem, a new path is that the vacancy induced charge carrier trap improves electronic interaction at Fermi level (E F ). [35][36][37] Although the vacancy charge defects in monolayer GaN have been studied, 38,39 the influence of vacancies on the electronic and optical properties of the bulk cubic GaN is entirely unknown.…”
Section: Introductionmentioning
confidence: 99%
“…Although the cubic GaN has been reported, 29 the structural, electronic and optical properties of the bulk cubic GaN have not well understood. Naturally, the overall properties of a semiconductor are markedly influenced by the defect 30‐34 . To solve the problem, a new path is that the vacancy induced charge carrier trap improves electronic interaction at Fermi level ( E F ) 35‐37 .…”
Section: Introductionmentioning
confidence: 99%