“…Alternatively, the present work clearly demonstrates a straightforward and systematic method to analyzing grain boundaries. The observed segregation widths are consistent with the highest resolution STEM-EDX data reported in the literature [19,20,37,38]. While STEM-EDX suffers from possible loss of resolution due to beam broadening, the spatial resolution in APT data is also limited by trajectory aberrations associated with non-uniform evaporation near grain boundaries and possible surface diffusion and retention effects.…”