2022
DOI: 10.1107/s1600577522003551
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The meV XUV-RIXS facility at UE112-PGM1 of BESSY II

Abstract: Resonant inelastic X-ray scattering in the XUV-regime has been implemented at BESSY II, pushing for a few-meV bandwidth in inelastic X-ray scattering at transition metal M-edges, rare earth N-edges and the K-edges of light elements up to carbon with full polarization control. The new dedicated low-energy beamline UE112-PGM1 has been designed to provide 1 µm vertical and 20 µm horizontal beam dimensions that serve together with sub-micrometre solid-state sample positioning as the source point for a high-resolut… Show more

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Cited by 5 publications
(4 citation statements)
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“…Figure a shows the experimental RIXS data of the La 5p 5 4f 1 3 D 1 and 3 D 2 final states of lanthanum metal, La 2 O 3 , SrLaAlO 4 , LaAlO 3 , LaPO 4 :Ce,Tb, and LaF 3 measured with unprecedented subnatural line width spectral resolution of 45–60 meV at the meV-RIXS experimental station of BESSY II . Gradual shift of the leading edge and different broadening are observed.…”
Section: Resultsmentioning
confidence: 99%
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“…Figure a shows the experimental RIXS data of the La 5p 5 4f 1 3 D 1 and 3 D 2 final states of lanthanum metal, La 2 O 3 , SrLaAlO 4 , LaAlO 3 , LaPO 4 :Ce,Tb, and LaF 3 measured with unprecedented subnatural line width spectral resolution of 45–60 meV at the meV-RIXS experimental station of BESSY II . Gradual shift of the leading edge and different broadening are observed.…”
Section: Resultsmentioning
confidence: 99%
“…In a nutshell, all levels are of mixed nature except for the energetically lowest 3 D 1 state. For this reason, we base all further analysis on the La 5p 5 4f 1 3 D 1 RIXS final state shown in Figure 2e, since the high spectral resolution 52 allows us to distinguish the 3 D 1 and 3 D 2 contributions, which were inseparable in previous work. 42,57 Figure 3.…”
Section: ■ Results and Discussionmentioning
confidence: 99%
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“…The N 4,5 -edges RIXS experiments were performed at BESSY II (Helmholtz-Zentrum Berlin) at the beamline UE112-PGM1 with the meV-RIXS spectrometer 66 and beamline U49 67 with the SolidFlexRIXS end station 68 . All thin films were grown on SrTiO 3 (STO) substrate if not explicitly noted.…”
Section: Methodsmentioning
confidence: 99%