The microbeam facility of the AN-2000 accelerator of the Laboratori Nazionali di Legnaro

Bollini, D.; Cervellera, F.; Egeni, G.P.; Mazzoldi, P.; Moschini, G.; Rossi, Paolo; Rudello, V.

doi:10.1016/0168-9002(93)90621-n

Cited by 22 publications

(7 citation statements)

References 3 publications

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“…µ-PIXE measurements were carried out at the Italian laboratory INFN-LNL AN2000 in-vacuum microbeam facility (2 MeV proton beam) (Bollini et al, 1993) and all the obtained results were gathered and reported in previous works (Re et al, 2011(Re et al, , 2013(Re et al, , 2015. µ-PIXE measurements were carried out at the Italian laboratory INFN-LNL AN2000 in-vacuum microbeam facility (2 MeV proton beam) (Bollini et al, 1993) and all the obtained results were gathered and reported in previous works (Re et al, 2011(Re et al, , 2013(Re et al, , 2015.…”

Section: Methodsmentioning

confidence: 99%

“…Finally, the µ-XRF data were compared with the µ-PIXE results performed on the same samples. µ-PIXE measurements were carried out at the Italian laboratory INFN-LNL AN2000 in-vacuum microbeam facility (2 MeV proton beam) (Bollini et al, 1993) and all the obtained results were gathered and reported in previous works (Re et al, 2011(Re et al, , 2013(Re et al, , 2015.…”

Section: Methodsmentioning

confidence: 99%

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µ-XRF Analysis of Trace Elements in Lapis Lazuli-Forming Minerals for a Provenance Study

et al. 2015

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This paper presents new developments on the provenance study of lapis lazuli started by our group in 2008: during the years a multi-technique approach has been exploited to obtain minero-petrographic characterization and creation of a database considering only rock samples of known provenance. Since the final aim of the study is to develop a method to analyze archeological findings and artworks made with lapis lazuli in a completely non-invasive way, ion beam analysis techniques were employed to trace the provenance of the raw material used for the production of artifacts. Continuing this goal and focusing the analysis on determination of more significant minero-chemical markers for the provenance study of trace elements in different minerals, the method was extended with the use of micro X-ray fluorescence (µ-XRF), to test the potential of the technique for this application. The analyzes were focused on diopside and pyrite in lapis lazuli samples of known provenance (Afghanistan, Tajikistan, and Siberia). In addition, µ-XRF data were compared with micro proton-induced X-ray emission (µ-PIXE) results to verify the agreement between the two databases and to compare the analytical performance of both techniques for this application.

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Section: Methodsmentioning

confidence: 99%

Section: Methodsmentioning

confidence: 99%

µ-XRF Analysis of Trace Elements in Lapis Lazuli-Forming Minerals for a Provenance Study

et al. 2015

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“…The crystal was cut along the [100] crystallographic direction and it was polished on the large face that was microfabricated and characterized. The sample was implanted at the AN2000 accelerator of the INFN -Legnaro National Laboratories 30 p. 4 with a scanning focused 1.2 MeV He + ion beam at a fluence of ~10 17 cm -2 . The beam spot size was ~10 µm and the beam current was comprised between 2 nA and 3 nA.…”

Section: A Ion Beam Fabricationmentioning

confidence: 99%

Kelvin probe characterization of buried graphitic microchannels in single-crystal diamond

Bernardi

Battiato

Olivero

et al. 2015

Journal of Applied Physics

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In this work, we present an investigation by Kelvin Probe Microscopy (KPM) of buried graphitic microchannels fabricated in single-crystal diamond by direct MeV ion microbeam writing. Metal deposition of variable-thickness masks was adopted to implant channels with emerging endpoints and high temperature annealing was performed in order to induce the graphitization of the highly-damaged buried region. When an electrical current was flowing through the biased buried channel, the structure was clearly evidenced by KPM maps of the electrical potential of the surface region overlying the channel at increasing distances from the grounded electrode. The KPM profiling shows regions of opposite contrast located at different distances from the endpoints of the channel. This effect is attributed to the different electrical conduction properties of the surface and of the buried graphitic layer. The model adopted to interpret these KPM maps and profiles proved to be suitable for the electronic characterization of buried conductive channels, providing a non-invasive method to measure the local resistivity with a micrometer resolution. The results p. 2 demonstrate the potential of the technique as a powerful diagnostic tool to monitor the functionality of all-carbon graphite/diamond devices to be fabricated by MeV ion beam lithography.

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“…Ion beam analyses were carried out mainly by means of two scanning proton micro-beam lines at INFN (National Institute for Nuclear Physics) facilities having different acceleration voltages: the 2.5 MV AN2000 accelerator at the Legnaro National Laboratory (INFN-LNL) in Padua (Figure 1) widely used for material characterization/modification and ion implantation [6]- [8] and the 3 MV accelerator of the INFN-LABEC Laboratory in Florence (Figure 2) widely used for multi-disciplinary studies [9]- [11]. In few cases also the in air AGLAE microbeam facility of the C2RMF in Paris was used [12].…”

Section: Instruments and Methodsmentioning

confidence: 99%

Ion Microbeam Analysis in Cultural Heritage: application to lapis lazuli and ancient coins

Giudice

Angelici

et al. 2017

ACTA IMEKO

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<p class="Abstract">Ion Beam Analyses (IBA) techniques, for example PIXE (Particle Induced X-ray Emission) and IL (IonoLuminescence), are a powerful analytical tool used to investigate the composition and structure of materials in cultural heritage. These techniques could be applied both in vacuum preparing the sample as in electron microscopy and in the air in a non-invasive way allowing to analyse artworks of practically any shape and dimension without sample preparation. Moreover the use of a focused beam (microbeam) permits to reach an analysis resolution of few micrometers in vacuum and ten micrometers in air.</p>In this work, instruments and methodologies are described and two examples of case study are reported: I) the mapping of elemental distribution in ancient roman coins; II) the trace elements measurement in lapis lazuli for provenance determination

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The microbeam facility of the AN-2000 accelerator of the Laboratori Nazionali di Legnaro

Cited by 22 publications

References 3 publications

µ-XRF Analysis of Trace Elements in Lapis Lazuli-Forming Minerals for a Provenance Study

µ-XRF Analysis of Trace Elements in Lapis Lazuli-Forming Minerals for a Provenance Study

Kelvin probe characterization of buried graphitic microchannels in single-crystal diamond

Ion Microbeam Analysis in Cultural Heritage: application to lapis lazuli and ancient coins

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