1990
DOI: 10.1016/0956-7151(90)90066-p
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The morphology of precipitates in an AlGe Alloy—I. experimental observations

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Cited by 27 publications
(15 citation statements)
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“…Similar inter-A MAJOR feature of the precipitation processes in pretations were also provided to explain changes in the binary Al-Ge and Al-Si alloys is the wide variety of shapes morphology of the Ge precipitates in an Al-1.3 wt pct Ge and habit planes of Ge and Si precipitates. [1,2,3] This is the alloy, in the sequence of {111} Al triangular plates → ͗100͘ Al direct consequence of the dissimilarities in the crystal struclaths → {100} Al plates, as functions of aging temperatures tures and of the large differences in the atomic volumes of ranging from 150 ЊC to 250 ЊC. [2] These results are indicative the parent and product phases.…”
Section: Introductionmentioning
confidence: 94%
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“…Similar inter-A MAJOR feature of the precipitation processes in pretations were also provided to explain changes in the binary Al-Ge and Al-Si alloys is the wide variety of shapes morphology of the Ge precipitates in an Al-1.3 wt pct Ge and habit planes of Ge and Si precipitates. [1,2,3] This is the alloy, in the sequence of {111} Al triangular plates → ͗100͘ Al direct consequence of the dissimilarities in the crystal struclaths → {100} Al plates, as functions of aging temperatures tures and of the large differences in the atomic volumes of ranging from 150 ЊC to 250 ЊC. [2] These results are indicative the parent and product phases.…”
Section: Introductionmentioning
confidence: 94%
“…[2] Given these similarities tates on the quenched-in excess vacancies [10,11] and variations in local vacancy supersaturation. [1,9] between the ͗100͘ Al laths formed in binary Al-Ge [3] and ternary Al-Ge-Si alloys, [8][9][10][11] it shows that Si additions to Figure 2(b) represents a transmission electron micrograph obtained from the baseline alloy when aged at 160 ЊC for Al-Ge alloys do not alter the crystallographic nature (i.e., habit plane, orientation relationships with the Al matrix, 24 hours. The micrograph was imaged near the ͗100͘ Al zone axis and was taken from a region of the thin foil where the growth direction, etc.)…”
Section: B Characterization Of Gesi Precipitates Formed In the C Almentioning
confidence: 99%
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