The multiple-scattering problem in electron Compton scattering on solids

Jonas, P. R.; Schattschneider, P.

doi:10.1080/13642819208207659

Cited by 22 publications

(9 citation statements)

References 17 publications

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“…d) As shown by Su et al [21] plasmon-Compton channel coupling alters the spectra mainly on their high energy-loss side which would qualitatively confirm the experimental observations. Since the simulated spectra do account for the plasmon-Compton channel coupling it follows that the effects of plasmon-channel coupling upon the profile are far below the observed broadening effect.…”

Section: Specimenssupporting

confidence: 78%

“…The effective momentum resolution, depedend on the angle of convergence of the primary electron beam incident on the specimen, spherical and chromatic aberration of the post specimen lenses, the diameter of the spectrometer and finally by the energy resolution, which can be achieved at present with our system is 6p% = 0.135 atomic units 1 [9]. By means of Fourier-techniques based simulations the impact of multiple scattering upon the Compton profiles have been shown; deconvolution routines and an approach to the elastic background problem were developped [21,9,10].…”

mentioning

confidence: 99%

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Electron Compton scattering in a symmetric two-beam scattering geometry

Jonas

Schattschneider

1993

Microsc. Microanal. Microstruct.

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Abstract. 2014 The aim of this work is to present an experimental procedure to measure directional Compton profiles by means of electron energy-loss spectroscopy in the transmission electron microscope. In order to obtain unique profiles with a well defined orientation in momentum space a symmetric two-beam scattering geometry taking advantage of crystal symmetry was developped. Measurements on single crystal silicon are discussed in comparison to results of other Compton scattering techniques and theoretical calculations.

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Section: Specimenssupporting

confidence: 78%

mentioning

confidence: 99%

Electron Compton scattering in a symmetric two-beam scattering geometry

Jonas

Schattschneider

1993

Microsc. Microanal. Microstruct.

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“…The Compton scattering spectrum extends over hundreds of electron volts, so the typical power-law background subtraction method does not work. In this work, the background of the ECOSS spectrum was subtracted by parameterized simulations of combined elastic and inelastic scattering events 28 . A characterization angle of 15 mrad and the ratio of quasi-elastic to inelastic scattering cross-sections of 0.8 were chosen for the background simulation.…”

Section: Resultsmentioning

confidence: 99%

Compton profile of few-layer graphene investigated by electron energy-loss spectroscopy

Feng

Zhang

Sakurai

et al. 2019

Sci Rep

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In this paper, acquisition of the valence Compton profile of few-layer graphene using electron energy-loss spectroscopy at large scattering angle is reported. The experimental Compton profile is compared with the corresponding theoretical profile, calculated using the full-potential linearized augmented plane wave method based on the local-density approximation. Good agreement exists between the theoretical calculation and experiment. The graphene profile indicates a substantially greater delocalization of the ground state charge density compared to that of graphite.

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“…N is the number of atoms per units area in the beam. In our simulation for a copper specimen the inelastic cross-section is computed using a modified hydrogenic L shell cross-section (Egerton, 1986) and a convolution method for multiple scattering (Su et al, 1992;Su & Zeitler, 1993). This multiple scattering simulation includes elastically scattered electrons, plasmon excitations and L edge ionization events.…”

Section: Kinematic Couplingmentioning

confidence: 99%

Diffraction effects in inner‐shell ionization edges

Schattschneider

Nelhiebel

Schenner

et al. 1996

Journal of Microscopy

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The influences of elastic on inelastic scattering under systematic-row conditions are described in a simple way. A kinematic approach, superposing inelastic intensitydistribution profiles centred at different Bragg spots is shown to be qualitatively correct but quantitatively unsatisfying. A model considering Bragg reflection of the fast electron before and after the inelastic scattering process and thus introducing interference effects is in good agreement with experimental results. Experimentally, we recorded inelastic intensities in the diffraction pattern of an epitaxial copper foil using a PEELS spectrometer and observed energy filtered extinction contours of a copper crystal.

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The multiple-scattering problem in electron Compton scattering on solids

Cited by 22 publications

References 17 publications

Electron Compton scattering in a symmetric two-beam scattering geometry

Electron Compton scattering in a symmetric two-beam scattering geometry

Compton profile of few-layer graphene investigated by electron energy-loss spectroscopy

Diffraction effects in inner‐shell ionization edges

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