The Noise Performance of Electron-Multiplying Charge-Coupled Devices at Soft X-Ray Energy Values

Tutt, James H.; Holland, Andrew D.; Murray, Neil J.; Hall, D.; Harriss, R. D.; Clarke, A. S.; Evagora, A.

doi:10.1109/ted.2012.2200488

Cited by 13 publications

(10 citation statements)

References 16 publications

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“…The concentration is described by a Fick diffusion profile and is typically of the order 10 16 atoms∕cm 3 at the charge storage location within the channel. 11,12 The substrate is also P-doped with boron, giving an estimated background concentration of approximately 10 15 atoms∕cm 3 based upon the known resistivity of 20 Ω:cm. 13 Additional implants are sometimes introduced according to the device architecture.…”

Section: Defect Formation In Emccdsmentioning

confidence: 99%

Proton-induced traps in electron multiplying charge-coupled devices

Bush

Hall

Holland

2021

J. Astron. Telesc. Instrum. Syst.

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Charge-coupled device (CCD)-based technologies exposed to high-energy radiation are susceptible to the formation of stable defects within the charge transfer channel that defer signal to subsequent pixels and limit the lifetime of the detector. Performance degradation due to these defects depends upon the interplay between the clock timings used to operate the device and the properties of defects introduced by irradiation. Characterization of both the type and number of post-irradiation defects makes it possible to minimize charge loss though the appropriate selection of clock timings for a given operating temperature. This technique has the potential to increase nominal mission lifetimes by several years for CCD-based instruments and is of particular significance to electron multiplying charge-coupled devices (EMCCDs) for photon counting applications where the effect of charge traps on low signal levels is expected to be most severe. We present a study of charge traps within CCDs, specifically within EMCCDs irradiated at room temperature to proton fluences up to and including 1.45 × 10 10 p þ ∕cm 2 (74 MeV). Defects are characterized through the "single-trap pumping" technique, with clocking schemes specifically designed for the 2-phase pixel architecture of the EMCCD. Five dominant trap species are thought to be introduced by the irradiation, the Si-E center, Si-A center, double and single acceptor charge states of the silicon divacancy (VV −− , VV − ), and an as yet unidentified defect referred to here as the Si-U center (the "unknown" trap). Energy-level and crosssection values are presented that allow inference of the defect landscape for a range of proton fluences and operating temperatures. While the study focuses specifically on EMCCDs, in more general terms, the results for trap properties are interpreted as being applicable to all CCD types following irradiation and can serve as a foundation for future charge loss correction and optimization techniques.

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Section: Defect Formation In Emccdsmentioning

confidence: 99%

Proton-induced traps in electron multiplying charge-coupled devices

Bush

Hall

Holland

2021

J. Astron. Telesc. Instrum. Syst.

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“…The multiplication gain will cause a degradation of the detectors spectral resolution, but the overlapping energies are sufficiently different in energy that his degradation will not be problematic. [17][18][19] Approximately 500 X-ray photons are expected during the 300 seconds flight. The ability of an EM-CCD to bring low energy X-ray events out of the noise will ensure that we are able to identify every photon that is incident onto the detector.…”

Section: Focal Plane Cameramentioning

confidence: 99%

The Off-plane Grating Rocket Experiment (OGRE) system overview

Tutt

McEntaffer

Donovan

et al. 2018

Space Telescopes and Instrumentation 2018: Ultraviolet to Gamma Ray

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The Off-plane Grating Rocket Experiment (OGRE) is a sub-orbital rocket payload that will make the highest spectral resolution astronomical observation of the soft X-ray Universe to date. Capella, OGRE's science target, has a well-defined line emission spectrum and is frequently used as a calibration source for X-ray observatories such as Chandra. This makes Capella an excellent target to test the technologies on OGRE, many of which have not previously flown. Through the use of state-of-the-art X-ray optics, co-aligned arrays of off-plane reflection gratings, and an X-ray camera based around four Electron Multiplying CCDs, OGRE will act as a proving ground for next generation X-ray spectrometers.

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“…This noise has been quantified as the excess noise factor 15 for optical photon detection and the modified Fano factor when detecting X-rays. 16,17 It causes a degradation of the spectral resolving power of the camera. It is important that this degradation of spectral resolution does not increase to a level where the detector can no longer be used to separate overlapping orders.…”

Section: Em-ccdsmentioning

confidence: 99%

Technological developments of the OGRE focal plane array

Tutt

McEntaffer

DeRoo³

et al. 2015

SPIE Proceedings

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The Off-plane Grating Rocket Experiment (OGRE) is a high resolution soft X-ray spectrometer sub-orbital rocket payload designed as a technology development platform for three low Technology Readiness Level (TRL) components. The incident photons will be focused using a light-weight, high resolution, single-crystal silicon optic. They are then dispersed conically according to wavelength by an array of off-plane gratings before being detected in a focal plane camera comprised of four Electron Multiplying Charge-Coupled Devices (EM-CCDs). While CCDs have been extensively used in space applications; EM-CCDs are seldom used in this environment and even more rarely for X-ray photon counting applications, making them a potential technology risk for larger scale X-ray observatories. This paper will discuss the reasons behind choosing EM-CCDs for the focal plane detector and the developments that have been recently made in the prototype camera electronics and thermal control system.

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The Noise Performance of Electron-Multiplying Charge-Coupled Devices at Soft X-Ray Energy Values

Cited by 13 publications

References 16 publications

Proton-induced traps in electron multiplying charge-coupled devices

Proton-induced traps in electron multiplying charge-coupled devices

The Off-plane Grating Rocket Experiment (OGRE) system overview

Technological developments of the OGRE focal plane array

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