The incorporation mechanism of Indium and Gallium during electrodeposition of Cu(In,Ga)Se 2 thin film from chloride electrolytes using sodium sulfamate as a complexing agent has been investigated by means of cyclic voltammetry (CV) coupled with EDS and Raman techniques. Cyclic voltammetry study was performed in unitary Cu, In, Ga and Se systems, binary Cu-Se system, ternary Cu-In-Se and Cu-Ga-Se systems, and quaternary Cu-In-Ga-Se system. EDS and Raman analysis were carried out to determine the evolution of film composition and phases, respectively. The insertion of In involves three different routes: firstly, surface-induced reduction by copper selenides to form CuInSe 2 ; secondly, reaction with H 2 Se to form indium selenide; thirdly, the direct reduction of In 3+ to In in the presence of high concentration In 3+ . While the Gallium incorporates through two paths: Ga 3+ reacts with H 2 Se to form gallium selenide; and Ga 2 O 3 forms via Ga 3+ hydrolysis from the increase of local pH.