1991
DOI: 10.1088/0034-4885/54/11/002
|View full text |Cite
|
Sign up to set email alerts
|

The phase problem of X-ray crystallography

Abstract: The electron density function of p ( r ) in a crystal determines its diffraction pattern, that is, both the magnitudes and phases of its x-ray diffraction maxima, and conversely. If, however, as is always the case, only magnitudes are available from the diffraction experiment, then the density function p ( r ) cannot be recovered. If one invokes prior structural knowledge, usually that the crystal is composed of discrete atoms of known atomic numbers, then the observed magnitudes are, in general, sufficient to… Show more

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
2
1

Citation Types

0
49
0

Year Published

2005
2005
2020
2020

Publication Types

Select...
5
3
1

Relationship

0
9

Authors

Journals

citations
Cited by 94 publications
(49 citation statements)
references
References 105 publications
0
49
0
Order By: Relevance
“…These techniques measure the intensity of radiation scattered by a material as a function of the radiation's incident angle allowing determination of structural correlations within the material. The shortcoming of scattering techniques is that the scattering intensities are not unique-multiple arrangements of atoms can result in the same scattering pattern [61]. This is true whether the incident radiation is scattered by electron clouds (e.g., X-rays) or atomic nuclei (neutrons).…”
Section: Characterizing Morphologymentioning
confidence: 99%
See 1 more Smart Citation
“…These techniques measure the intensity of radiation scattered by a material as a function of the radiation's incident angle allowing determination of structural correlations within the material. The shortcoming of scattering techniques is that the scattering intensities are not unique-multiple arrangements of atoms can result in the same scattering pattern [61]. This is true whether the incident radiation is scattered by electron clouds (e.g., X-rays) or atomic nuclei (neutrons).…”
Section: Characterizing Morphologymentioning
confidence: 99%
“…The scattered intensities provide insight into the length scales of spatial correlations in a material, but these correlations are averaged over relatively large sample volumes, often masking non-negligible structural features [62]. Unfortunately, because of the scattering uniqueness problem, it is not generally possible to deconvolve a scattering pattern into atomic coordinates without additional information [61]. Therefore, the ability compare simulated structures against experimental ones depends on the ability to transform atomic coordinates into scattering patterns.…”
Section: Characterizing Morphologymentioning
confidence: 99%
“…Procedures exist, for both crystalline (6) and non-crystalline samples (7), to reconstruct ρðxÞ from the scattering pattern. Equation 1 can be obtained from a purely classical description of electromagnetic radiation scattered by a stationary electron density (5), yielding a result identical to that obtained from a quantum electrodynamics (QED) description of light.…”
mentioning
confidence: 99%
“…The measurement of the specularly reflected intensity in term of the wave number q perpendicular to the sample surface provides important information on the atomic or magnetic scattering length density (SLD) profile of the nanostructure materials along their depth x [3]. However, extracting the profile from the measured reflectivity R(q), as a function of q, has been hampered by the so called phase problem [4,5]. This problem refers to the loss of the phase of reflection coefficient in any scattering problem.…”
Section: Introductionmentioning
confidence: 99%