2004
DOI: 10.1016/j.nimb.2004.04.185
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The potential of external IBA and LA-ICP-MS for obsidian elemental characterization

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Cited by 14 publications
(16 citation statements)
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“…The results of sensitive LA-ICP-MS elemental/isotopic measurements can be used to support the use of other instrumental meth- ods such as Scanning Electron Microscopy with Energy Dispersive X-Ray Spectrometry (SEM-EDS) [12,31,38,74,79,112,118,130,135,166,170,181,182], Electron Probe Microanalysis (EPMA) [75, 80, 81, 97, 112, 167, 183 -185], X-Ray Fluorescence (XRF) [16,31,35,44,93,94,98,119,120], Proton Induced X-Ray Emission [22,41,95,114,186,187] or Neutron Activation Analysis (NAA) [23, 36, 99, 100, 107, 108, 114, 146, 188 -192]. Leroy et al [193] reported the first application of confocal Synchrotron Radiation micro X-Ray Fluorescence (SR-m-XRF) with LA-ICP-MS.…”
Section: Multi-technique Approach Incorporating La-icp-msmentioning
confidence: 99%
“…The results of sensitive LA-ICP-MS elemental/isotopic measurements can be used to support the use of other instrumental meth- ods such as Scanning Electron Microscopy with Energy Dispersive X-Ray Spectrometry (SEM-EDS) [12,31,38,74,79,112,118,130,135,166,170,181,182], Electron Probe Microanalysis (EPMA) [75, 80, 81, 97, 112, 167, 183 -185], X-Ray Fluorescence (XRF) [16,31,35,44,93,94,98,119,120], Proton Induced X-Ray Emission [22,41,95,114,186,187] or Neutron Activation Analysis (NAA) [23, 36, 99, 100, 107, 108, 114, 146, 188 -192]. Leroy et al [193] reported the first application of confocal Synchrotron Radiation micro X-Ray Fluorescence (SR-m-XRF) with LA-ICP-MS.…”
Section: Multi-technique Approach Incorporating La-icp-msmentioning
confidence: 99%
“…A large number of elements were determined, ranging from major (Si, Al, Ca, Na, K) to minor (Fe, Mn, Mg, Ti, Rb) to trace constituents, including essentially all the elements not mentioned before. It should be highlighted that the distinction between minor and trace components is purely indicative as large variations in concentration are a distinctive feature of obsidians (typical ranges are reported in [57]). …”
Section: Obsidianmentioning
confidence: 99%
“…the concentration of one element, chosen as the internal standard, is determined by means of a different technique (Instrumental Neutron Activation Analysis, INAA or X-Ray Fluorescence, XRF). Silicon is mostly used [50,52,55,57] although sodium [58] and aluminum [55,56] are employed at times, 2. the signals of the analytes (S Ai ) and the internal standard is registered and, after blank subtraction, the first ones are ratioed to the latter (S Ai /S IS ), 3. the analyte to internal standard ratio in the sample is converted into a concentration by comparison with the same ratio in a solid standard material.…”
Section: Obsidianmentioning
confidence: 99%
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