“…Since the absolute value of the coating height, the height of the coating measured from the substrate, is a product of relative coating height and a single track height, H, we can combine equations (5), (6) and (7), to: is a function containing only constants a, b, c, d and β, processing parameters, F, S, and an overlap ratio, OR, [11]. The relative coating height and the relative coating waviness only depend on the overlap ratio, i.e.…”