The present state of quantitative X-ray microanalysis Part 2: Computational methods

Electron probe microanalysis applied to very thin layers of aluminium‐nickel alloys

“…Finally, and taking into account the physical meaning (pt)i = mi (8) where mi denotes the mass of analyte (i) in g cm-2, it is obvious that the total mass of n-component alloy thin film sample in g cm-' is given by n m = p t = E m k k = 1 and that Since the denominator of Eqn (5) contains @t) and X M j which imply the knowledge of (~t )~ for every i, we see that the calculation has to be done by successive approximations. For the first approximation [@t)Mi] we adopt (9)…”

X-Ray Absorption and Emission

“…Archard and Mulvey (18) have proposed a model for x-ray generation which is based on the idea of the electrons traveling into the sample in a straight line to some point P which is related to the average range for the electrons. The electrons then diffuse out from this point, losing energy according to Bethe's law.…”

Electron Microscopy

“…Zeitler and Bahr (512,513) present a photometric procedure which permits weight determinations of electron microscopically visible particles down to [10][11][12][13][14][15][16][17][18] gram. This quantitative method is dependent on the linear part of the curve that established the relationship of weight per unit area to photometric transmission through the electron microscopical image formed on photographic film.…”