1975
DOI: 10.1080/713819083
|View full text |Cite
|
Sign up to set email alerts
|

The Problem of Phase Retrieval in Light and Electron Microscopy of Strong Objects

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
2
1
1
1

Citation Types

0
20
0

Year Published

1976
1976
2022
2022

Publication Types

Select...
5
1

Relationship

0
6

Authors

Journals

citations
Cited by 51 publications
(20 citation statements)
references
References 4 publications
0
20
0
Order By: Relevance
“…As another example, in an optical imaging system it may be possible to measure the field intensity in two slightly defocused planes. For this case it has also been shown that there is a unique solution to the phase retrieval problem [9,19].…”
Section: 2: the Phase Retrieval Problemmentioning
confidence: 99%
See 4 more Smart Citations
“…As another example, in an optical imaging system it may be possible to measure the field intensity in two slightly defocused planes. For this case it has also been shown that there is a unique solution to the phase retrieval problem [9,19].…”
Section: 2: the Phase Retrieval Problemmentioning
confidence: 99%
“…Finally, suppose that NŽ2 and consider the sequence xz ( n). Since A X 2 (z) = 2 + 2z-' + 5z -N (4)(5)(6)(7)(8)(9)(10)(11)(12)(13)(14)(15)(16)(17)(18)(19)(20)(21)(22)(23) has no zeros on the unit circle or in reciprocal pairs, then o,(W,I 2 ) along the line oz=No, is also sufficient to uniquely specify x(n,,n 2 ) to within a scale factor provided NŽ2. This approach of transforming multidimensional sequences into their I-D projections provides only a partial answer to the uniqueness question.…”
Section: Iv3: Uniqueness Via Projectionsmentioning
confidence: 99%
See 3 more Smart Citations