The Realization-Independent Testing Based on the Black Box Fault Models

Bareiša, Eduardas; Jusas, Vacius; Motiejūnas, Kęstutis; Šeinauskas, Rimantas

doi:10.15388/informatica.2005.081

Cited by 8 publications

(4 citation statements)

References 17 publications

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“…Therefore, the test obtained using the PT model should be significantly longer and should test more stuck-at faults, as the test stimuli better cover the paths of the circuit. This conclusion was validated by the experiments presented in [14].…”

Section: The Input-input-output Pin Triplet Fault Modelsupporting

confidence: 68%

“…However, the experimental researches proved that the situation is different. The test stimulus detecting pin pair faults does not detect only one and a half percent of stuck-at faults on the average [14]. This result can be explained by the fact that each test stimulus detects the stuck-at faults on several paths between the input and the output.…”

Section: The Input-output Pin Pair Fault Modelmentioning

confidence: 92%

“…The input-input-output pin stuck-at fault triplets (x i t , y h p , z j k ), t=0,1, k=0,1, p=0,1 are called the pin triplet faults (PT) [14]. The number of possible pin triplets faults of the circuit is at most 4×n×n×m.…”

Section: The Input-input-output Pin Triplet Fault Modelmentioning

confidence: 99%

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Black-Box Fault Models

Bareiša

Jusas

Motiejūnas

et al. 2006

ITC

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Four black-box fault models are introduced in the paper. The test generation task for the black-box model is more complicated, because possible realizations of the design must be taken into account. However, the time required to generate tests is not very critical factor, because the test generation can be done in parallel with the circuit synthesis process without a prolongation of Time-to-Market. All the proposed fault models were analyzed and investigated experimentally. On the basis of these results, an appropriate fault model responding to the complexity of the problem being solved can be selected.

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Section: The Input-input-output Pin Triplet Fault Modelsupporting

confidence: 68%

Section: The Input-output Pin Pair Fault Modelmentioning

confidence: 92%

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Black-Box Fault Models

Bareiša

Jusas

Motiejūnas

et al. 2006

ITC

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“…We are also interested in various modifications to this problem. We are unaware of analytical methods of solving this three-dimensional relationship problem even in the case when detailed module descriptions are at hands (Bareisa et al, 2005).…”

Section: Introductionmentioning

confidence: 99%

Functional Test Generation Based on Combined Random and Deterministic Search Methods

et al. 2007

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The aim of this paper is to explore some features of the functional test generation problem, and on the basis of the gained experience, to propose a practical method for functional test generation. In the paper presented analysis of random search methods and adjacent stimuli generation allowed formulating a practical method for generating functional tests. This method incorporates the analyzed termination conditions of generation, exploits the advantages of random and deterministic search, as well as the feature that the sets of the selected input stimuli can be merged easily in order to obtain a better set of test patterns.

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