2003
DOI: 10.1111/j.1745-3984.2003.tb01100.x
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The Relationship Between Item Exposure and Test Overlap in Computerized Adaptive Testing

Abstract: The purpose of this article is to present an analytical derivation for the mathematical form of an average between-test overlap index as a fitnction of the item exposure index, for fixed-length computerized aahptive tests (CATs). This algebraic relationship is used to investigate the simultaneous control of item exposure at both the item and test levels. The results indicate that, in jixed-length CATs, control of the average between-test overlap is achieved via the mean and variance of the item exposure rates … Show more

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Cited by 57 publications
(78 citation statements)
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“…This method thus imposes the content constraints by “brute force.” It does not look at future consequences when selecting an item, but simply picks the best item from a set when its turn has arrived according to the minimax principle. CAT studies in which this method has been used have been reported in Chen, Ankenmann, and Spray (1999, April) and Leung, Chang, Hau, and Wen (2001, April; 2003, April).…”
Section: Item‐selection Methodsmentioning
confidence: 99%
“…This method thus imposes the content constraints by “brute force.” It does not look at future consequences when selecting an item, but simply picks the best item from a set when its turn has arrived according to the minimax principle. CAT studies in which this method has been used have been reported in Chen, Ankenmann, and Spray (1999, April) and Leung, Chang, Hau, and Wen (2001, April; 2003, April).…”
Section: Item‐selection Methodsmentioning
confidence: 99%
“…To control item exposure and test overlap simultaneously, the relationship between the two indices needs to be identified first. The relationship between item exposure and pairwise test overlap has been provided by Chen, Ankenmann, and Spray (2003) and can be expressed as:…”
Section: Introductionmentioning
confidence: 99%
“…The lower the maximum item exposure rate is, the more even the usage of the item bank is, and the smaller the mean of test overlap rates is. This relation is expected and has been mathematically proved by Chen, Ankenmann, and Spray (2003).…”
Section: Test Securitymentioning
confidence: 83%