2010
DOI: 10.1088/1742-6596/209/1/012019
|View full text |Cite
|
Sign up to set email alerts
|

The role of rough surfaces in quantitative ADF imaging of gallium nitride-based materials

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
2

Citation Types

0
2
0

Year Published

2011
2011
2011
2011

Publication Types

Select...
1
1

Relationship

0
2

Authors

Journals

citations
Cited by 2 publications
(2 citation statements)
references
References 5 publications
0
2
0
Order By: Relevance
“…). Ra is the arithmetic average of the absolute values and Rz is the average distance between the highest peak and lowest valley in each sampling length . As observed for the determination of roughness‐related parameters, in contrast to other brands, there were higher values of Ra for brand A (Fig.…”
Section: Resultsmentioning
confidence: 72%
See 1 more Smart Citation
“…). Ra is the arithmetic average of the absolute values and Rz is the average distance between the highest peak and lowest valley in each sampling length . As observed for the determination of roughness‐related parameters, in contrast to other brands, there were higher values of Ra for brand A (Fig.…”
Section: Resultsmentioning
confidence: 72%
“…In this sense, it is very difficult to predict shrinkage and warpage of processed materials using these distinct methods . Rq is commonly used to better describe the variance of the topographical profile of a surface . In addition to brand A, Rq also enabled the detection of statistically significant differences along the brand B tubes, which was not possible by analyzing Ra.…”
Section: Resultsmentioning
confidence: 99%