2023 International Conference on Noise and Fluctuations (ICNF) 2023
DOI: 10.1109/icnf57520.2023.10472745
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The Role of Tunneling Oxide in the Low Frequency Noise of Multi-level Silicon Nitride ReRAMs

Nikolaos Vasileiadis,
Alexandros Mavropoulis,
Christoforos Theodorou
et al.
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