The scanning tunneling microscopy combined with the scanning electron microscopy—A tool for the nanometry

Abstract

Articles you may be interested inCombined scanning force microscopy and scanning tunneling spectroscopy of an electronic nanocircuit at very low temperature Appl. Phys. Lett. 90, 043114 (2007); Two scanning tunneling microscopes (STMs) compatible with scanning electron microscope or optical microscope are presented. One STM is based on bimorph piezos and has a scanning range of about 10 fim. The other STM is based on a solid piezoblock with frequencies higher than 8 kHz and with a scanning range of about 3 fim. Some results demonstrate the capabilities of these microscopes. Among them are the observations of the microbridge, of the grain boundary in twinned crystal, the imaging of topography, and tunneling current distribution on the cleaved multilayer GaAs-AlGaAs structure.

STM/STS study of superconducting diamond

“…In this work we used two different STM systems: one for the temperature range 1.8-4.5 K, the other for measurement at lower temperatures down to 0.5 K. Both systems contain STMs operating under ultrahigh vacuum conditions. The former setup [6] uses a cryogenic pump, and allows choice of scanning area over the entirety of the sample's surface with tip position viewing through an optical system. Thus, a relatively flat area of the surface can be chosen.…”