2020 IEEE 40th International Conference on Electronics and Nanotechnology (ELNANO) 2020
DOI: 10.1109/elnano50318.2020.9088861
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The selection of the test pulse duration for a shock excitation study of ultrasonic transducers

Yurii Onykiienko
1
,
Olena Batina
2
,
Ganna Vlasyuk
3
et al.
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