1995
DOI: 10.1111/j.1151-2916.1995.tb08481.x
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The SiO2‐Si3N4 Interface, Part I: Nature of the Interphase

Abstract: Recent reports in the literature have suggested that Si2N2O forms in the oxidation of Si3N4 as a buffer suboxide below the silica crust, and that equilibrium between SiO2 and Si3N4 requires the presence of this buffer. Here we report the examination of SiO2/Si3N4 boundaries of different genesis, by a variety of techniques, all of which failed to detect Si2N2O. What was found in each case is a graded suboxide whose composition merges seamlessly with the higher oxide above and the Si3N4 below. Part I presents th… Show more

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Cited by 70 publications
(35 citation statements)
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“…6), it showed that oxidation behavior followed a parabolic rate law, indicating that the step of diffusion of oxygen through the oxide product layer to the oxide/Si 3 N 4 interface is the rate-controlling step, which is in coincident with the results in literatures [7][8][9][10][11][12][13].…”
Section: Oxidation Products and Kineticssupporting
confidence: 79%
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“…6), it showed that oxidation behavior followed a parabolic rate law, indicating that the step of diffusion of oxygen through the oxide product layer to the oxide/Si 3 N 4 interface is the rate-controlling step, which is in coincident with the results in literatures [7][8][9][10][11][12][13].…”
Section: Oxidation Products and Kineticssupporting
confidence: 79%
“…Al 2 O 3 , Y 2 O 3 , etc., and found that the oxidation also followed the parabolic rate law but they reported that the oxide layer formed could not prevent Si 3 N 4 from being oxidized efficiently, implying that the rate-controlling step was not the outward diffusion of oxygen through the silicate film, but the outward diffusion of cations in the intergranular glass. Ogbuji and Bryan [9] and Ogbuji [10] also compared the oxidation rate of Si 3 N 4 (CVD) with SiC (CVD) in the temperature range from 1473 to 1773 K…”
Section: Oxidation Wherementioning
confidence: 98%
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“…This assumption results in impossibly high nitrogen pressures at the Si2ON2/N2 interface (Du et al, 1989b). Other work by Ogbuji and Bryan (1995) shows an amorphous oxynitride layer with a continuous gradation in oxygen and nitrogen composition from SiO2 to Si3N4. The accompanying model (Ogbuji, 1995) proposes that oxidation proceeds by a substitution of oxygen for nitrogen across the graded SiOxNy network rather than at an interface.…”
Section: Oxidation Of Pure Si3n4 In Dry Oxygenmentioning
confidence: 99%