The Sorcerer's Apprentice Guide to Fault Attacks

Bar-El, Hagai; Choukri, Hamid; Naccache, David; Tunstall, Michael; Whelan, Claire

doi:10.1109/jproc.2005.862424

Cited by 588 publications

(395 citation statements)

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“…There exist various means for injecting faults, such as electromagnetic or laser radiation, power or clock signal tampering, etc. [1,2]. By causing a fault with a specific effect, an attacker can cause sensitive information to be leaked.…”

Section: Introductionmentioning

confidence: 99%

Efficient Design and Evaluation of Countermeasures against Fault Attacks Using Formal Verification

Goubet

Heydemann

Encrenaz

et al. 2016

Smart Card Research and Advanced Applications

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Abstract. This paper presents a formal verification framework and tool that evaluates the robustness of software countermeasures against faultinjection attacks. By modeling reference assembly code and its protected variant as automata, the framework can generate a set of equations for an SMT solver, the solutions of which represent possible attack paths. Using the tool we developed, we evaluated the robustness of state-of-theart countermeasures against fault injection attacks. Based on insights gathered from this evaluation, we analyze any remaining weaknesses and propose applications of these countermeasures that are more robust.

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Section: Introductionmentioning

confidence: 99%

Efficient Design and Evaluation of Countermeasures against Fault Attacks Using Formal Verification

Goubet

Heydemann

Encrenaz

et al. 2016

Smart Card Research and Advanced Applications

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“…Normally an attacker gets faulty ciphertexts by giving external impact on a device with voltage variation, glitch, laser, etc. [4]. The first DFA presented by Biham and Shamir in 1997 [8] targeted DES [1].…”

Section: Introductionmentioning

confidence: 99%

Differential fault analysis of AES: Toward reducing number of faults

Kim

2012

Information Sciences

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Differential Fault Analysis (DFA) finds the key of a block cipher using differential information between correct and faulty ciphertexts obtained by inducing faults during the computation of ciphertexts. Among many ciphers AES has been the main target of DFA due to its popularity. DFA of AES has also been diversified into several directions: reducing the required number of faults, applying it to multi-byte fault models, extending to AES-192 and AES-256, or exploiting faults induced at an earlier round.This article deals with the first three directions together, especially giving weight to reducing the required number of faults. Many previous works show that the required numbers of faults are different although the same fault model is used. This comes from lack of a general method of constructing and solving differential fault equations. Therefore we first present how to generate differential fault equations systematically and reduce the number of candidates of the key with them, which leads us to find the minimum number of faults. Then we extend to multi-byte fault models and AES-192/256.

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“…The heating of cryptographic devices Variations in the operating temperature of cryptographic devices cause faulty computations or random modifications of memory cells. Although CMOS technology is quite resistant to low temperatures, high temperatures lead to variances in the device characteristics like circuit conductance, leakage current, or diode voltage drops [24,3]. Nevertheless, the heating of semiconductors can only be achieved by global means.…”

Section: Fault Analysis On Rfid Tagsmentioning

confidence: 99%

“…Sudden changes in power levels or signal clock cycles are called spikes and glitches, respectively. These variations may cause the chip to either misinterpret instructions or to modify the values of internal data-bus lines of semiconductors [1,3]. This form of intervention can only be performed in a global manner but have to be injected very precisely in time.…”

Section: Fault Analysis On Rfid Tagsmentioning

confidence: 99%

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RFID and Its Vulnerability to Faults

Hutter

Schmidt

Plos

Cryptographic Hardware and Embedded Systems – CHES 2008

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Abstract. Radio Frequency Identification (RFID) is a rapidly upcoming technology that has become more and more important also in securityrelated applications. In this article, we discuss the impact of faults on this kind of devices. We have analyzed conventional passive RFID tags from different vendors operating in the High Frequency (HF) and Ultra-High Frequency (UHF) band. First, we consider faults that have been enforced globally affecting the entire RFID chip. We have induced faults caused by temporarily antenna tearing, electromagnetic interferences, and optical inductions. Second, we consider faults that have been caused locally using a focused laser beam. Our experiments have led us to the result that RFID tags are exceedingly vulnerable to faults during the writing of data that is stored into the internal memory. We show that it is possible to prevent the writing of this data as well as to allow the writing of faulty values. In both cases, tags confirm the operation to be successful. We conclude that fault analysis poses a serious threat in this context and has to be considered if cryptographic primitives are embedded into low-cost RFID tags.

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The Sorcerer's Apprentice Guide to Fault Attacks

Cited by 588 publications

References 20 publications

Efficient Design and Evaluation of Countermeasures against Fault Attacks Using Formal Verification

Efficient Design and Evaluation of Countermeasures against Fault Attacks Using Formal Verification

Differential fault analysis of AES: Toward reducing number of faults

RFID and Its Vulnerability to Faults

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