The status and future of diamond thin film FED

Küttel

Journal of Vacuum Science &Amp; Technology B: Microelectronics and Nanometer Structures Processing, Measurement, and Phenomena

et al. 1999

Section: Introductionmentioning

confidence: 71%

Field emission properties of nanocrystalline chemically vapor deposited-diamond films

Küttel

Journal of Vacuum Science &Amp; Technology B: Microelectronics and Nanometer Structures Processing, Measurement, and Phenomena

et al. 1999

Applied Physics Letters

“…4 This was very promising from a technological point of view since the incorporation of such materials in a gated structure, like a flat panel display ͑FED͒, could be done easily over large areas at low cost using standard chemical vapor deposition techniques. 5,6 However there is an increasing number of indications that the enhanced FE is due to intense local electric fields caused by protrusions in the m and nm range. 7,8 The production of such protruding field enhancing structures ͑FES͒ in gated patterns is a problem of technological relevance.…”

Section: ͓S0003-6951͑00͒00815-9͔mentioning

confidence: 99%

Scanning field emission from patterned carbon nanotube films

Nilsson

Gröening

Emmenegger

et al. 2000

944

566

The investigation of the field emission (FE) properties of carbon nanotube (CNT) films by a scanning anode FE apparatus, reveals a strong dependence on the density and morphology of the CNT deposit. Large differences between the microscopic and macroscopic current and emission site densities are observed, and explained in terms of a variation of the field enhancement factor β. As a consequence, the emitted current density can be optimized by tuning the density of CNTs. Films with medium densities (on the order of 107 emitters/cm2, according to electrostatic calculations) show the highest emitted current densities.

Journal of Vacuum Science &Amp; Technology B: Microelectronics and Nanometer Structures Processing, Measurement, and Phenomena

“…In macroscopic tests, the ''turn-on'' voltage was 6.5 MV/m ͑6.5 V/m͒ for a threshold current density of 0.1 A/m 2 ͑10 A/cm 2 ͒ and at 13 MV/m the current density increased to 800 A/m 2 . 19 The sample was stored in air for 18 months before SPFM characterization.…”

Section: Characterization Of Field-emission Sitesmentioning

confidence: 99%

Scanning field-emission force microscopy and spectroscopy of chemical-vapor-deposited carbon field-emission cathodes

Inoue

Ogletree

Salmerón

2001

A scanning-force microscope with an electrically conducting tip was used in both contact and noncontact scanning-polarization force microscopy modes to study the field-emission properties of diamond-like carbon chemical-vapor-deposited films in vacuum. Using the tip as an anode, the emission current and work function were measured with 100 nm lateral resolution. Emission was detected from individual micron-size grains. Large current fluctuations on a ms time scale were observed, correlated with large changes in surface potential, possibly due to charge trapping. There were no significant differences in work function between emitting and nonemitting regions, but the emitting regions showed low conductivity and large band gaps, while the nonemitting regions were either insulating or highly conductive. No asperities were observed at the film-vacuum interface. The current dependence on tip-sample separation suggests that emission occurs below, and not at, the film-vacuum interface.