The Storing Matter technique: application to polymer samples using Ag collectors

Becker, N.; Wirtz, Tom; Migeon, H.-N.

doi:10.1002/sia.3446

Cited by 13 publications

(18 citation statements)

References 7 publications

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“…Such a procedure has been applied recently and used for analysis of several materials. [4][5][6] So far, however, the processes of ion erosion/deposition and SIMS analysis are performed in two separate vacuum chambers. The substrate with the deposit has to be transported between the two chambers with the use of an ultra-high vacuum case.…”

Section: Introductionmentioning

confidence: 99%

Storing matter technique performed in the analytical chamber of a quadrupole SIMS analyser

Konarski

Miśnik

Zawada

et al. 2014

Surface & Interface Analysis

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The storing matter technique is applied in quadrupole type SIMS analyser. Its analytical chamber is additionally equipped with a special magnetically driven x, Θ, UHV manipulator applied for transfer of the metal ring collector. The sample holder, horizontally positioned, carries the analysed sample as well as a watch like rotation mechanism carrying a continuously rotating collector of 1 inch diameter at a rate of 1 rev. per hour. The procedure includes cleaning of the collector with the ion beam, the collector reverse, sputter deposition of the analysed material from the sample onto the clean surface of the collector, reversal of the sample and analysis of the stored material. The whole procedure is performed in one analytical chamber, using a Physical Electronics 06-350E sputter ion gun and QMA-410 Balzers quadrupole mass analyser. The procedure is tested on pure chromium and is applied to an inconel alloy implanted with 120 keV Cr 2+ and 145 keV Y 2+. The SIMS results are obtained using 5 and 3 keV Ar + ion beam at 45°incidence angle. As the collector, we use high purity titanium. The obtained depth profile analysis of the inconel alloy shows that the 'matrix effect' is largely reduced when compared with standard SIMS analysis. The storing matter procedure was performed with the use of oxygen flooding (during sputter deposition and during SIMS analysis). Results show significant improvement with respect to the use of this technique without oxygen flooding.

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Section: Introductionmentioning

confidence: 99%

Storing matter technique performed in the analytical chamber of a quadrupole SIMS analyser

Konarski

Miśnik

Zawada

et al. 2014

Surface & Interface Analysis

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“…[6][7][8] The analytical potential of the technique for organic samples has also been assessed. [9][10][11][12] The primary ion fluence limit for monatomic primary ions defining the static regime, the analysis depth, the extent of molecular fragmentation, and the rearrangements and chemical reactions induced by the primary ion beam are key parameters for the analysis of organic matter by static SIMS. [13] For the storing matter technique, the sticking probabilities of the fragments of different size on the collector surface and the second fragmentation during subsequent time-of-flight (ToF)-SIMS analysis are of highest importance too.…”

Section: Introductionmentioning

confidence: 99%

Fragmentation of polystyrene during sputter deposition in the storing matter instrument

Turgut

Wirtz²,

Belmahi

et al. 2014

Surface & Interface Analysis

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19th International Conference on Secondary Ion Mass Spectrometry (SIMS), Jeju, SOUTH KOREA, SEP 29-OCT 04, 2013International audienceThe storing matter technique has been developed to get easier quantification in secondary ion mass spectrometry (SIMS) by decoupling the sputtering step from the analysis step. First, the matter is deposited in the submonolayer range on a collector that is analysed next by SIMS. Most work on the storing matter technique has been carried out for inorganic samples. The technique has also been applied successfully to organic samples. In this work, the fragmentation of polystyrene (PS) molecule deposited on silver (Ag) during storing matter deposition is investigated using static SIMS analysis with Bi-3(+) clusters. The fragmentation of PS at different coverages is studied by calculating the ratios of large-to-small peak intensities of fingerprint spectra. These ratios are compared with those obtained previously by the storing matter technique using Ar+ as analysis beam in time-of-flight-SIMS. Different degrees of fragmentation are observed with varying coverage, suggesting different sticking factors of fragments on the collector. Compared with Bi-3(+), the Ar+ projectile produces a higher amount of large fragments and is found to be better suited for the analysis of PS deposits on silver collectors. In both situations, C7H7+ is the major fragment in the mass spectra

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“…Promising results showed that molecular information is preserved to a degree where polymer identification is possible. [18][19][20][21][22] Important aspects of the technique like the sticking of the sputtered organic matter on the collector surface and other processes, which could affect ToF-SIMS results, have been studied for polystyrene (PS) [23,24] and resulted in an approach, which could be used to identify surface reactions.…”

Section: Introductionmentioning

confidence: 99%

Optimizing the sputter deposition process of polymers for the Storing Matter technique using PMMA

et al. 2016

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Quantitative analyses in secondary ion mass spectrometry (SIMS) become possible only if ionization processes are controlled. The Storing Matter technique has been developed to circumvent this so-called matrix effect, primarily for inorganic samples, but has also been extended to organic samples. For the latter, it has been applied to polystyrene in order to investigate the extent of damage in the polymer, its fragmentation during the sputter deposition process and the effect of the deposition process on the spectra taken by Time-of-Flight SIMS (ToF-SIMS). In this work, a multi-technique approach, which employs the Storing Matter technique for deposition and ToF-SIMS and X-ray photoelectron spectroscopy for characterization, is used to enhance the control of the deposition process, including the thickness of the deposit, the alteration of the source film and the influence of polymer composition on the Storing Matter process. Poly (methyl methacrylate) (PMMA) is used for this work. More detailed information about the sticking of polymer fragments on the metal collector is obtained by density functional theory calculations. This work allows for the conclusion that a part of the fragments deposited on the collector surface diffuses on the latter, reacts and recombines to form larger fragments. The behaviour observed for PMMA is similar to polystyrene, showing that oxygen has no major influence on the processes occurring during the sputter deposition process. Additionally, we have developed a new methodology using 2D ToF-SIMS images of the deposit to monitor the deposit thickness and to identify surface contaminations. The latter are not only located at the position of the deposit but all over the collector surface. Copyright © 2016 John Wiley & Sons, Ltd.

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The Storing Matter technique: application to polymer samples using Ag collectors

Cited by 13 publications

References 7 publications

Storing matter technique performed in the analytical chamber of a quadrupole SIMS analyser

Storing matter technique performed in the analytical chamber of a quadrupole SIMS analyser

Fragmentation of polystyrene during sputter deposition in the storing matter instrument

Optimizing the sputter deposition process of polymers for the Storing Matter technique using PMMA

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