2022
DOI: 10.1016/j.susc.2022.122062
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The structure of Mn3O4 (110) thin films

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Cited by 13 publications
(6 citation statements)
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“…To further confirm that the species presented on the surface of the perovskite film is Mn 3 O 4 after evaporation, X-ray photoelectron spectroscopy (XPS) and Raman characterizations are performed. As revealed in Figure e,f, the two peaks at 641.85 and 653.71 eV are assigned to the XPS of Mn 2p . Similarly, the peak located at 529.8 eV are attributed to the XPS of O 1s .…”
Section: Resultsmentioning
confidence: 75%
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“…To further confirm that the species presented on the surface of the perovskite film is Mn 3 O 4 after evaporation, X-ray photoelectron spectroscopy (XPS) and Raman characterizations are performed. As revealed in Figure e,f, the two peaks at 641.85 and 653.71 eV are assigned to the XPS of Mn 2p . Similarly, the peak located at 529.8 eV are attributed to the XPS of O 1s .…”
Section: Resultsmentioning
confidence: 75%
“…As revealed in Figure e,f, the two peaks at 641.85 and 653.71 eV are assigned to the XPS of Mn 2p . Similarly, the peak located at 529.8 eV are attributed to the XPS of O 1s . Moreover, the two distinct Raman peaks at 489 and 656 cm –1 are observed which correspond to the standard peaks of Mn 3 O 4 (Figure S1).…”
Section: Resultsmentioning
confidence: 93%
“…The deposition rate was estimated to be 0.15-0.2 nm min À1 for Mn 3 O 4 , as calibrated by TEM measurements as in.ref. 15 The evaporation was followed by post-annealing up to B 550 K at p(O 2 ) = 5Â 10 À7 mbar for 20 min to promote thin film crystallization and Co incorporation within the Mn 3 O 4 matrix. The overall thin film is B2 nm thick.…”
Section: Experimental Set-upmentioning
confidence: 99%
“…1(b). The deposition rate was estimated to be 0.15–0.2 nm min −1 for Mn 3 O 4 , as calibrated by TEM measurements as in ref. 15.…”
Section: Experimental Set-upmentioning
confidence: 99%
“…A variety of stoichiometries and structures exist for MnO x (1 < x < 2), among which Mn 3 O 4 (hausmannite, with a spinel structure) is of particular research interest because of the mixed valence states of Mn (3+ and 2+) and the possibility of a variety of surface terminations. Mn 3 O 4 growth has been studied on a range of crystalline substrates, each with a varying degree of influence on the terminations and atomic structures of Mn 3 O 4 via the mechanisms of epitaxy and associated strain, e.g., SrTiO 3 (001) [7][8][9], SrTiO 3 (111) [9,10], Si(001) [11,12], Ag(001) [13][14][15], Pd(001) [16], Cu(111) [14,17,18], and Au(111) [14,[19][20][21]. The atomic and crystalline structures of the Mn 3 O 4 films were investigated using X-ray diffraction (XRD) [7,8,10,12,21], reflection high energy electron diffraction (RHEED) [8], transmission electron microscopy (TEM) [12], atomic force microscopy (AFM) [7,10], scanning tunneling microscopy (STM) [15,17,19,20], scanning transmission electron microscopy (STEM) [17], and low-energy electron diffraction (LEED) [13][14][15][17][18][19].…”
Section: Introductionmentioning
confidence: 99%