The Substructure of Austenite and Martensite through a Carburized Surface

Estimation of lattice strain in nanocrystalline RuO2 by Williamson–Hall and size–strain plot methods

“…Generally the X-ray diffraction peak broadening is due to the instrumental broadening, increase in crystallite size and lattice strain due to dislocation [23]. To decouple these contributions, it is necessary to collect a diffraction pattern of a standard material such as silicon to determine the instrumental broadening [24].…”

10MeV Au ion irradiation effects in an MgO–HfO2 ceramic–ceramic (CERCER) composite

“…Also X-ray peak intensities decreased while background increased, with increasing ion fluence. We believe this is due to an accumulation of lattice defects produced during irradiation as suggested by Makinson et al [30] in their study of defects in nanocrystalline materials. tion.…”

Low-temperature growth and characterization of neodymium-substituted bismuth titanate nanowires in a highly ordered anodic aluminum oxide template by an AC electrodeposition method on the platinum substrate for ferroelectric applications

“…It shows a shift in the peak position toward the higher angle side and this may be due to because of the following reasons: the internal stress/strain of the material, doping of lower ionic radii into the host lattice, and stacking fault of doping in the host lattice [23]. in that region.…”