“…A schematic of the dedicated hard X-ray microprobe bending magnet beamline, X-26A at the NSLS, is depicted in Figure and can serve as a generic example of a hard X-ray microprobe. Similarly configured hard X-ray microprobes are operating at second- and third-generation synchrotron facilities worldwide. ,,,,,,− ,,,,,,,,,− Hard X-ray microprobes utilizing white light (continuum) provide the ability to conduct rapid nondestructive trace element microanalysis on a wide range of samples with little sample preparation. Detection limits for elements Z > 20 by SXRF at many second-generation synchrotron sources is in the low μg g -1 to high ng g -1 range with a factor of 10 improvement being realized at third-generation sources.…”