1984
DOI: 10.1016/0022-4596(84)90100-2
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The ternary system titanium-aluminum-nitrogen

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Cited by 193 publications
(103 citation statements)
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“…As the temperature was increased to 1300 ºC, Ti 2 AlN became the dominant crystalline phase (96.6 wt%) with 2.7 wt% TiN and 0.7 wt% TiAl 3 . This XRD analysis suggests the following reactions are possible during SPS [9,10,12]:…”
Section: Icdd Data Used Includementioning
confidence: 87%
See 1 more Smart Citation
“…As the temperature was increased to 1300 ºC, Ti 2 AlN became the dominant crystalline phase (96.6 wt%) with 2.7 wt% TiN and 0.7 wt% TiAl 3 . This XRD analysis suggests the following reactions are possible during SPS [9,10,12]:…”
Section: Icdd Data Used Includementioning
confidence: 87%
“…Al melts at approximately 660 ºC (reaction 1) while reaction between Ti and Al forms Ti-Al intermetallics such as TiAl and TiAl 3 [9,10,12] at approximately 700-900 ºC. Formation of Ti-Al intermetallics has also been found during synthesis of layered ternary ceramics such as Ti 2 AlC [21] and Ti 3 AlC 2 [22].…”
Section: Nanowhisker-containing Microstructuresmentioning
confidence: 99%
“…The history of theoretical predictions of new MAX phases begins with the debate on the structure of Ti 4 AlN 3 , which in the 1990s was proposed to be either Ti 3 AlN 2 or Ti 3 Al 2 N 2 [83,84], but was finally determined to be Ti 4 AlN 3 [85,86,87]. This conclusion inspired Holm et al [88] [89], and it was logical to proceed with an attempt to synthesize Ti 4 SiC 3 .…”
Section: Predictions Of New Max Phasesmentioning
confidence: 99%
“…However, at high ion energies, a steep price is extracted in the form of residual ion-induced compressive stress. 20,21 Early studies of these effects characterized differences in film growth kinetics as a function of the average ion energy per deposited atom 〈 〉. 22,23,24 It was soon realized, however, that 〈 〉, the product of the ion energy Ei and Ji/JMe (the ratio of the accelerated rare-gas ion flux Ji to the deposited metal atom flux JMe) is not a universal parameter for describing the effects of low-energy ion irradiation on film microstructure.…”
Section: Introductionmentioning
confidence: 99%