The Thickness Dependence of the X-Ray Diffuse Scattering Intensity for Crystals with Microdefects at Laue-Case Diffraction

Kochelab, V. V.; Molodkin, V. B.; Olikhovskii, S. I.; Osinovskii, M. E.

doi:10.1515/9783112501306-004

July 1988 1988

DOI: 10.1515/9783112501306-004

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The Thickness Dependence of the X-Ray Diffuse Scattering Intensity for Crystals with Microdefects at Laue-Case Diffraction

V. V. Kochelab¹,

V. B. Molodkin²,

S. I. Olikhovskii³

et al.

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The Thickness Dependence of the X-Ray Diffuse Scattering Intensity for Crystals with Microdefects at Laue-Case Diffraction

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