The Transiently Unstable Phenomenon of I–V Curves of ITO/a-Si:H Junctions

Tiep, Nguyen Huy; Tran, Duc Hai; Thien, Nguyen Duy; Nhat, Hoang Nam; Cuong, Le Viet

doi:10.1007/s11664-024-11710-9

J. Electron. Mater.

2024

DOI: 10.1007/s11664-024-11710-9

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The Transiently Unstable Phenomenon of I–V Curves of ITO/a-Si:H Junctions

Nguyen Huy Tiep,

Duc Hai Tran,

Nguyen Duy Thien

et al.

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The Transiently Unstable Phenomenon of I–V Curves of ITO/a-Si:H Junctions

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