Transmission Electron Microscopy 2009
DOI: 10.1007/978-0-387-76501-3_1
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The Transmission Electron Microscope

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Cited by 276 publications
(244 citation statements)
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“…In [6,16] , it is illustrated we can assume that the HAADF detector collects electrons complementary to the electrons scattered to angles smaller than its inner detector angle. The electrons can also be scattered to angles beyond the outer detector angle, but the proportion is negligibly small.…”
Section: The Nonlinear Modelmentioning
confidence: 99%
“…In [6,16] , it is illustrated we can assume that the HAADF detector collects electrons complementary to the electrons scattered to angles smaller than its inner detector angle. The electrons can also be scattered to angles beyond the outer detector angle, but the proportion is negligibly small.…”
Section: The Nonlinear Modelmentioning
confidence: 99%
“…New classes of oxide magnets with interesting properties, for example, colossal magnetoresistance, appeared at that time [1]. Novel methods of synthesis of epitaxial films (pulsed laser deposition (PLD) method) and nanostructure investigation (transmission electron microscope (TEM), force microscopes) were being implemented [2,3]. It became apparent that nanoparticles of some magnetic oxides might find practical application in medicine, particularly, for enhancing the sensitivity of diagnostics methods (MRI) [4], and in therapy (hyperthermia treatment, targeted drug delivery etc.)…”
Section: Introductionmentioning
confidence: 99%
“…Experimental analyses are often based on diffraction patterns, e.g. from X-rays [15] or electrons [21]. The most common technique for symmetry extraction from crystalline images is the classification of the Bragg reflections [3], i.e.…”
Section: Introductionmentioning
confidence: 99%