2015
DOI: 10.1016/j.matchar.2014.10.023
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The TriBeam system: Femtosecond laser ablation in situ SEM

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Cited by 143 publications
(82 citation statements)
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“…This process is shown schematically in Figure 1(a). 9,20 The stage on which the sample is mounted is composed of piezoelectric driven actuators (X, Y, Z, tilt) with 50 nm resolution that permit material removal by incrementally moving the sample surface into the scanning beam path, which is described in more detail elsewhere. 9,20 A Ti:sapphire gain medium femtosecond laser operating at 780 nm wavelength and 1 kHz repetition rate was used to ablate the sample surface in a FIB-SEM vacuum chamber at a pressure of 4 Â 10 À6 mbar.…”
Section: Methodsmentioning
confidence: 99%
See 1 more Smart Citation
“…This process is shown schematically in Figure 1(a). 9,20 The stage on which the sample is mounted is composed of piezoelectric driven actuators (X, Y, Z, tilt) with 50 nm resolution that permit material removal by incrementally moving the sample surface into the scanning beam path, which is described in more detail elsewhere. 9,20 A Ti:sapphire gain medium femtosecond laser operating at 780 nm wavelength and 1 kHz repetition rate was used to ablate the sample surface in a FIB-SEM vacuum chamber at a pressure of 4 Â 10 À6 mbar.…”
Section: Methodsmentioning
confidence: 99%
“…During irradiation by a femtosecond pulse (typically 150 fs for a Ti:Sapphire laser), the photon energy is absorbed by the electronic structure to 20-500 nm within the sample surface. [20][21][22][23] The excited electron energy is then deposited after a time period of the order of 10 ps, during a thermalization event. Volumetric expansion of the highly excited surface region projects two waves: one compressive and, picoseconds later, a tensile wave that is reflected off the top surface of the expanding surface layer.…”
Section: Introductionmentioning
confidence: 99%
“…Other, destructive techniques combine optical or electron microscopy to serial sectioning [49,54,55]. Of course, 2D-only characterizations are also often used [56,57].…”
Section: Application To Raster Polycrystal Imagesmentioning
confidence: 99%
“…A femtosecond pulsed laser, which provides an ablation rate four to six orders of magnitude higher than a Ga + ion beam, 27 was used to reduce the time needed for the rough cut of the buckle cross section. The use of a femtosecond pulsed laser allows structuring of materials with ideally no heat affected zone as a result of the ultrashort pulse duration, but the shock wave of the ablation process can lead to the injection of dislocations.…”
Section: Materials and Experimentsmentioning
confidence: 99%