2023
DOI: 10.1016/j.vacuum.2022.111681
|View full text |Cite
|
Sign up to set email alerts
|

The ultra-thin AlN epitaxy on monolayer WS2 by helicon sputtering at 400 °C

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
2
1

Citation Types

0
3
0

Year Published

2023
2023
2024
2024

Publication Types

Select...
5

Relationship

1
4

Authors

Journals

citations
Cited by 5 publications
(3 citation statements)
references
References 28 publications
0
3
0
Order By: Relevance
“…In contrast with graphene, 2D material TMDCs, such as WS 2 and MoS 2 , are known to be lattice-matched with GaN [ 86 89 ]. Research is also carried out to study the TMDCs-assisted nitrides vdW epitaxy [ 90 92 ]. Gupta et al try the nitrides growth on the Si/SiO 2 substrate with the assistance of the mechanical exfoliated WS 2 and MoS 2 interlayer, respectively [ 93 ].…”
Section: Modulation Mechanisms In 2d-material-assisted Epitaxymentioning
confidence: 99%
“…In contrast with graphene, 2D material TMDCs, such as WS 2 and MoS 2 , are known to be lattice-matched with GaN [ 86 89 ]. Research is also carried out to study the TMDCs-assisted nitrides vdW epitaxy [ 90 92 ]. Gupta et al try the nitrides growth on the Si/SiO 2 substrate with the assistance of the mechanical exfoliated WS 2 and MoS 2 interlayer, respectively [ 93 ].…”
Section: Modulation Mechanisms In 2d-material-assisted Epitaxymentioning
confidence: 99%
“…Then, the subsequent AlN film formed on the layered AlN/ WS 2 switched to three-dimensional growth, exhibiting a highly c-axis oriented structure, high crystallinity, and larger grain size. 16 The attractiveness of III-nitride-based optoelectronic devices on Si substrates is attributed to the low cost and large wafer area, along with the potential for integrating them with other devices on the same platform. 17 However, the large difference in the thermal expansion coefficients and the lattice constant mismatch between Si and III-nitride compounds result in the cracking of III-nitride epitaxial layers.…”
Section: ■ Introductionmentioning
confidence: 99%
“…Huang et al showed that layered 3 nm-thick AlN films form a 2D hexagonal lattice aligned with the WS 2 lattice via van der Waals epitaxy at the early stage of the AlN film growth. Then, the subsequent AlN film formed on the layered AlN/WS 2 switched to three-dimensional growth, exhibiting a highly c -axis oriented structure, high crystallinity, and larger grain size …”
Section: Introductionmentioning
confidence: 99%