2004
DOI: 10.1016/j.apradiso.2004.03.102
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The use of amorphous Silicon flat panels as detector in neutron imaging

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Cited by 15 publications
(4 citation statements)
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“…See figure 10 0.7200 199.9 99.2745 6 detection, defined by the method through which their internal electric field is established; the merits and difficulties associated with each class are discussed below in the context of application. The charge-coupled device (CCD), although reported in the solid-state neutron detection literature [144,159,160] (not to be associated with scintillation-based CCD transduction [161,162]), is not included as its own class here due to its limitations in radiation hardness, temporal resolution and ability to detect over a continuous area [163]; however, some of the CCD limitations have recently been rectified with the charge injection device (CID) which may be worth further investigation [164]. For the detector class in which the internal electrical field is produced only by an external voltage (as shown schematically in figure 4(a)) the dielectric is a direct-conversion material that acts to both capture neutrons as well as transduce the primary capture reaction products.…”
Section: Norm (%)mentioning
confidence: 99%
“…See figure 10 0.7200 199.9 99.2745 6 detection, defined by the method through which their internal electric field is established; the merits and difficulties associated with each class are discussed below in the context of application. The charge-coupled device (CCD), although reported in the solid-state neutron detection literature [144,159,160] (not to be associated with scintillation-based CCD transduction [161,162]), is not included as its own class here due to its limitations in radiation hardness, temporal resolution and ability to detect over a continuous area [163]; however, some of the CCD limitations have recently been rectified with the charge injection device (CID) which may be worth further investigation [164]. For the detector class in which the internal electrical field is produced only by an external voltage (as shown schematically in figure 4(a)) the dielectric is a direct-conversion material that acts to both capture neutrons as well as transduce the primary capture reaction products.…”
Section: Norm (%)mentioning
confidence: 99%
“…As a result, the sensitivity of Gadox scintillators with 50µm and 110µm thickness was 0.59 and 1.01 GL/pixel/neutron respectively. And also the sensitivity of LiF/ZnS:Ag scintillator with 70µm thickness was 0.90 GL/pixel/neutron [8].…”
Section: Resultsmentioning
confidence: 97%
“…In most cases, however, scintillator screens in conjunction with either charge-coupled device (CCD) cameras or sometimes flat amorphous-Si detectors are utilized (see figure 4), both of which can be read out digitally. Amorphous-Si flat panels require shorter exposure times and provide faster continuous read-out [22][23][24][25], while state-of-the-art scintillator CCD combinations [4,26] are superior concerning dynamic range and signal-to-noise and so give improved image quality. Unlike amorphous silicon, CCD chips cannot be placed directly in a neutron beam, since they would suffer radiation damage.…”
Section: Detectionmentioning
confidence: 99%