The Use of Dual-Frequency Allocation Method in the Construction of Informative Signal Measuring Circuits of the Primary Eddy Current Probes

Abramov, S. V.

doi:10.21685/2307-5538-2017-3-12

MMMC

2017

DOI: 10.21685/2307-5538-2017-3-12

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The Use of Dual-Frequency Allocation Method in the Construction of Informative Signal Measuring Circuits of the Primary Eddy Current Probes

S. V. Abramov¹

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The Use of Dual-Frequency Allocation Method in the Construction of Informative Signal Measuring Circuits of the Primary Eddy Current Probes

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