Photoenergy and Thin Film Materials 2019
DOI: 10.1002/9781119580546.ch9
|View full text |Cite
|
Sign up to set email alerts
|

The Use of Power Spectrum Density for Surface Characterization of Thin Films

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
2
1
1

Citation Types

0
24
0

Year Published

2019
2019
2022
2022

Publication Types

Select...
5
2

Relationship

1
6

Authors

Journals

citations
Cited by 27 publications
(27 citation statements)
references
References 26 publications
0
24
0
Order By: Relevance
“…Positive values of X indicate that the surfaces are dominated by the features of the high domain. In this case, all the connectivity values are positive indicating dominance of plateaus on all the surfaces [28,29]. However, as shown in Fig.…”
Section: Fractal Analysesmentioning
confidence: 89%
See 2 more Smart Citations
“…Positive values of X indicate that the surfaces are dominated by the features of the high domain. In this case, all the connectivity values are positive indicating dominance of plateaus on all the surfaces [28,29]. However, as shown in Fig.…”
Section: Fractal Analysesmentioning
confidence: 89%
“…Surface roughness has also been shown to influence other properties such as tribology [7], wettability, transparency and hydrophobicity [8,9] and so many other physical and chemical characteristics of thin films as presented in literature [10,11]. As such, detailed characterisation of surface roughness is critical for quality control and optimisation of functionality of the thin films.…”
Section: Introduction mentioning
confidence: 99%
See 1 more Smart Citation
“…The power spectral density (PSD) was used to analyze the surface roughness of the plaques. PSD is a fractal method that is considered as one of the better characterization techniques of surface topography and has been used by different researchers [ 57 , 58 ]. A detailed discussion of PSD can be found in the references [ 59 , 60 ].…”
Section: Methodsmentioning
confidence: 99%
“…Recent studies highlighted that 3-D surface topology/micromorphology of samples obtained from SEM and AFM micrographs can be characterized by stereometric analyses (Rezaee et al, 2020;Shakoury et al, 2020;Sobola et al, 2020; (Mwema, Akinlabi, & Oladijo, 2019) applied to the AFM data (Sobola, Ţ alu, Solaymani, & Grmela, 2017). In the literature it was observed that various scientific studies about surface texture, cutting edge phenomenon and tool wear in various conventional and advanced honing processes have been done (Ţ alu, 2015; Ţ alu, 2020).…”
mentioning
confidence: 99%