2017
DOI: 10.1149/07711.2011ecst
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The Use of Silicon Wafer Barriers in the Electrochemical Reduction of Solid Silica to Form Silicon in Molten Salts

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Cited by 4 publications
(2 citation statements)
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“…The p-n samples were contaminated by W, which originated from the electrode leads, whereas Al contamination was released from the quartz crucible . The purity was increased when using Si contacting electrodes instead of the foreign metal electrode. , The electro-reduced silicon was upgraded to SoG-Si by subsequent zone melting purification. , …”
Section: Purity Concerns and Solutionsmentioning
confidence: 99%
See 1 more Smart Citation
“…The p-n samples were contaminated by W, which originated from the electrode leads, whereas Al contamination was released from the quartz crucible . The purity was increased when using Si contacting electrodes instead of the foreign metal electrode. , The electro-reduced silicon was upgraded to SoG-Si by subsequent zone melting purification. , …”
Section: Purity Concerns and Solutionsmentioning
confidence: 99%
“…69 The purity was increased when using Si contacting electrodes instead of the foreign metal electrode. 80,81 The electro-reduced silicon was upgraded to SoG-Si by subsequent zone melting purification. 82,83 Contamination by calcium originates either from the molten salt entrapped in the surface structure or the calcium metal deposited at negative polarization.…”
Section: Purity Concerns and Solutionsmentioning
confidence: 99%