The X-ray diagnostic beamline at the Canadian Light Source

Bergstrom, John C.; Vogt, J.

doi:10.1016/j.nima.2008.01.080

Cited by 8 publications

(3 citation statements)

References 4 publications

Supporting

Mentioning

Contrasting

Order By: Relevance

“…The data were compared with measurements recorded with a 30 mm pinhole camera at a diagnostic BM beamline, X-ray Synchrotron Radiation (XSR) (Bergstrom & Vogt, 2008). The pinhole measurements were made at the same time as the ps-BPM measurements.…”

Section: Resultsmentioning

confidence: 99%

A real-time phase-space beam emittance monitoring system

Samadi

Shi

Dallin

et al. 2019

J Synchrotron Radiat

View full text Add to dashboard Cite

An electron beam position and angle monitoring system, ps-BPM, has been shown to be able to measure the electron source position and angle at a single location in a beamline at a synchrotron source. This system uses a monochromator to prepare a photon beam whose energy is at that of the K-edge of an absorber filter. The divergence of the beam from the source gives an energy range that will encompass the K-edge of the filter. A measurement of the centre of the monochromatic beam and the K-edge location through the absorber filter gives the position and angle of the electron source. Here, it is shown that this system is also capable of measuring the source size and divergence at the same time. This capability is validated by measurement as the beam size in the storage ring was changed and by ray-tracing simulations. The system operates by measuring the photon beam spatial distribution as well as a K-edge filtered beam distribution. These additional measurements result in the ability to also determine the electron source size and divergence.

show abstract

Section: Resultsmentioning

confidence: 99%

A real-time phase-space beam emittance monitoring system

Samadi

Shi

Dallin

et al. 2019

J Synchrotron Radiat

View full text Add to dashboard Cite

show abstract

“…The spatial resolution better than a few microns is now demanded for transverse beam profiling on the most performing light sources. For this purpose X-ray pinhole cameras are widely used due to simple setup and high practical reliability [2][3][4][5]. Typically a pinhole based emittance monitor has a limited resolution of 10 µm.…”

Section: Introductionmentioning

confidence: 99%

“…Due to its non-destructive nature, synchrotron radiation from a bending magnet is a versatile tool for beam profile measurements and is used in nearly every accelerator [1]. The spatial resolution of transverse beam profiling is now demanded to be better than a few microns on the most high brilliance light sources, so for this purpose X-ray pinhole cameras are widely used due to their simple setup and high practical reliability [2][3][4][5]. Typically, a pinhole-based emittance monitor has a limited resolution of 10 μm.…”

Section: Introductionmentioning

confidence: 99%

The beam-based calibration of an X-ray pinhole camera at SSRF

Leng¹,

Huang²,

Zhang³

et al. 2012

Chinese Phys. C

View full text Add to dashboard Cite

The Shanghai Synchrotron Radiation Facility (SSRF) contains a 3.5-GeV storage ring serving as a national X-ray synchrotron radiation user facility characterized by a low emittance and a low coupling. The stability and quality of the electron beams are monitored continuously by an array of diagnostics. In particular, an X-ray pinhole camera is employed in the diagnostics beamline of the ring to characterize the position, size, and emittance of the beam. The performance of the measurement of the transverse electron beam size is given by the width of the point spread function (PSF) of the X-ray pinhole camera. Typically the point spread function of the X-ray pinhole camera is calculated via analytical or numerical method. In this paper we will introduce a new beam based calibration method to derive the width of the PSF online.

show abstract