Articles you may be interested inOptical emission and mass spectroscopic studies of the gas phase during the deposition of SiO2 and aSi:H by remote plasmaenhanced chemical vapor deposition J. Vac. Sci. Technol. A 7, 1115 (1989); 10.1116/1.576239Laserinduced chemical vapor deposition of hydrogenated amorphous silicon. I. Gasphase process model Low-temperature silicon oxide films were successfully grown using SiHcN20 mixtures by a continuous wave-C0 2 laser tuned at 10.6 /-tm in a parallel configuration. The reaction was initiated by high gas temperatures obtained as a result of multiple successive absorption of photons by silane molecules, followed by energy redistribution through intermolecular collisions. The study of film growth rate and properties as influenced by both total gas pressure and substrate temperature for a gas mole ratio ip= P N 2 d P SiH4 = 30 demonstrated that peak gas temperature controls the deposition rate, revealing that the process is driven by gas phase reactions. For the process, apparent activation energy was determined to be 45 kcallmol, and apparent overall order of the reaction m = -1.5. The gas temperature distribution was calculated by means of a steady-state energy balance in the gas volume, explaining very well the experimental growth rates and the properties of the obtained films.