1985
DOI: 10.1071/ph850371
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Theoretical and Experimental Techniques for the Determination of X-ray Anomalous Dispersion Corrections

Abstract: Aust. J. Phys., 1985,38, 371-404 Theoretical and experimental techniques for the determination of the X-ray anomalous dispersion corrections f'(w, LI) and fl/(w, LI) are discussed. The results of experiments on metallic, ionic and covalently bonded materials typified by copper and nickel, lithium fluoride, and silicon respectively are compared with the theoretical predictions. Attention is drawn to deficiencies in both the experimental and the theoretical approaches.

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Cited by 13 publications
(13 citation statements)
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“…Another technique uses measurements of /"(CJJ, 0). The deficiencies of this approach have been discussed by Creagh (1980Creagh ( , 1984Creagh ( , 1986. However, serious attempts to determine f'(CJJ, 0) through measurements of f"(CJJ, 0) have been made by Gerward et al (1979), Dreier et al (1984), Creagh (1980), Bonse and Henning (1985), Bonse and Hartmann-Lotsch (1984), Kawamure and Fukamachi (1978) and Fukamachi et aL (1978).…”
Section: Resultsmentioning
confidence: 99%
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“…Another technique uses measurements of /"(CJJ, 0). The deficiencies of this approach have been discussed by Creagh (1980Creagh ( , 1984Creagh ( , 1986. However, serious attempts to determine f'(CJJ, 0) through measurements of f"(CJJ, 0) have been made by Gerward et al (1979), Dreier et al (1984), Creagh (1980), Bonse and Henning (1985), Bonse and Hartmann-Lotsch (1984), Kawamure and Fukamachi (1978) and Fukamachi et aL (1978).…”
Section: Resultsmentioning
confidence: 99%
“…It is not my intention here to describe these techniques since I have reviewed the subject recently (Creagh 1986). Suffice to say that direct measurements of f'(CJJ, 0) using X-ray interferometers have been made by, inter alia, Cusatis and Hart (1975), Siddons and Hart (1983), Begum et al (1986), Bpnse and Materlik (1975), Bonse and Hartmann-Lotsch (1984), Bonse and Henning (1985) and Creagh (1984).…”
Section: Resultsmentioning
confidence: 99%
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