Theoretical approach to CMOS APS PSF and MTF modeling - evaluation

Grois, Dan; Shcherback, I.; Danov, T.; Yadid-Pecht, Orly

doi:10.1109/jsen.2005.856128

Cited by 9 publications

(3 citation statements)

References 11 publications

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“…Although the calculated MTF results agree well with measured data of fabricated imagers based on three different pixel designs in a 0.5 μm CMOS process, the final expression is only barely outlined and cannot be easily used. MTF modelling was also considered in [42]. In this case, the model is based on the solution of the two-dimensional diffusion equation and covers the impact of the pixel active area geometrical shape.…”

Section: B 2d Modelsmentioning

confidence: 99%

A Review of CMOS Photodiode Modeling and the Role of the Lateral Photoresponse

Blanco-Filgueira

López

Roldán

2016

IEEE Trans. Electron Devices

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CMOS photodiodes are the primary photosensing devices used in nowadays solid-state image sensors. A review of significative CMOS photodiodes models that can be found in the literature of the last years is presented here. We have focused on photodiodes current models in one, two and three dimensions, and we have paid special attention to lateral current components. Lateral collection, particularly for small photodiodes fabricated in deep submicron technologies, has been shown to be of utmost importance. Finally, several models to account for crosstalk effects are also described.

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Section: B 2d Modelsmentioning

confidence: 99%

A Review of CMOS Photodiode Modeling and the Role of the Lateral Photoresponse

Blanco-Filgueira

López

Roldán

2016

IEEE Trans. Electron Devices

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“…The MTF is the modulus of the Fourier transform of the PSF. The MTF determines the upper limits in image quality, i.e., the image resolution or sharpness, and describes the image quality in terms of contrast as a function of spatial frequency [21].…”

Section: Introductionmentioning

confidence: 99%

A Method to Better Account for Modulation Transfer Functions in ARSIS-Based Pansharpening Methods

Massip

Blanc

Wald

2012

IEEE Trans. Geosci. Remote Sensing

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Massip P., Blanc Ph., Wald L., A method to better account for modulation transfer functions in ARSIS-based pan-sharpening methods. IEEE Transactions in Geoscience and Remote Sensing, 99, 1-9, 2011, doi : 10.1109/TGRS.2011 1 Abstract-Multispectral (MS) images provided by EarthObservation satellites have generally a poor spatial resolution while panchromatic images (PAN) exhibit a spatial resolution two or four times better. Data fusion is a mean to synthesize MS images at higher spatial resolution than original by exploiting the high spatial resolution of the PAN. This process is often called pan-sharpening. The synthesis property states that the synthesized multispectral images should be as close as possible to those that would have been acquired by the corresponding sensors if they had this high resolution. The methods based on the concept ARSIS are able to deliver synthesized images with good spectral quality but whose geometrical quality can still be improved. We propose a more precise definition of the synthesis property in terms of geometry. Then, we present a method that takes explicitly into account the difference in modulation transfer function (MTF) between PAN and MS in the fusion process. This method is applied to an existing ARSIS-based fusion method: ATWT-M3. Simulated images of the sensors Pleiades and SPOT-5 are used to illustrate the performances of the approach. Though this study is limited in methods and data, we observe a better restitution of the geometry and an improvement in all indices classically used in quality budget in pan-sharpening. We present also a means to assess the respect of the synthesis property from a MTF point of view.

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“…In an effort to improve APS performance, the role of pixel geometry on image quality has been investigated both theoretically and experimentally in the past decade. [2][3][4][5][6][7][8][9][10][11][12][13][14][15] Considerable work remains to understand the design factors driving performance given the variety of APS architectures, and the complex three-dimensional topology of the pixels.…”

Section: Introductionmentioning

confidence: 99%

Improvements to spectral spot-scanning technique for accurate and efficient data acquisition

et al. 2009

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An improved and optimized spectral spot-scanning system for visible focal plane array (FPA) sub-micron pixel photoresponse testing is presented. This updated configuration includes: (1) additional diagnostic analysis tools which more completely characterize the operation of the system; (2) a confocal microscope fitted into the optical system to aid in more precise determination of spot focusing on the imager; (3) a post-acquisition transformation to imager pixel response data to reduce overall data acquisition time. Wavelength-dependent pixel response data is presented to demonstrate the repeatability of this setup as well as to quantify the impact of random and systematic experimental errors.

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Theoretical approach to CMOS APS PSF and MTF modeling - evaluation

Cited by 9 publications

References 11 publications

A Review of CMOS Photodiode Modeling and the Role of the Lateral Photoresponse

A Review of CMOS Photodiode Modeling and the Role of the Lateral Photoresponse

A Method to Better Account for Modulation Transfer Functions in ARSIS-Based Pansharpening Methods

Improvements to spectral spot-scanning technique for accurate and efficient data acquisition

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