1981
DOI: 10.1007/3540105212_8
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Theoretical aspects of monocrystal sputtering

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Cited by 56 publications
(9 citation statements)
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“…Furthermore, in the case of the (111) surface the nearest neighbours are aligned in rows perpendicular to the surface plane, which is also the preferential direction of sputtered atom emission from bcc crystals, as known from experiments [10,11]. Perpendicular emission from a flat surface is the most efficient one for sputtering, as the ability of an atom to escape the surface potential depends on its velocity in the direction of the surface normal [8]. These considerations imply that for the (111) surface the knock-on sputtering mechanisms in single-atom irradiation are already quite efficient.…”
Section: Discussionmentioning
confidence: 97%
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“…Furthermore, in the case of the (111) surface the nearest neighbours are aligned in rows perpendicular to the surface plane, which is also the preferential direction of sputtered atom emission from bcc crystals, as known from experiments [10,11]. Perpendicular emission from a flat surface is the most efficient one for sputtering, as the ability of an atom to escape the surface potential depends on its velocity in the direction of the surface normal [8]. These considerations imply that for the (111) surface the knock-on sputtering mechanisms in single-atom irradiation are already quite efficient.…”
Section: Discussionmentioning
confidence: 97%
“…The experiments by Saidoh and Sone [41] show roughly the same value for 1 keV Mo ions, although the nuclear stopping power at this energy is over a factor of four higher [25] for Mo ions than for Ne ions. In the kiloelectronvolt energy range the channelling of ions is known to have an effect on the sputtering yields [8,9]. To gain a qualitative understanding of the sputtering yields obtained from the simulations, we follow the model by Onderdelinden [9,43] assuming that the channelled fraction of the ion beam does not contribute to the sputtering.…”
Section: Single-atom Irradiationmentioning
confidence: 99%
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“…The third technique has been developed to reduce the effects of channelling. By exposing the device to the ion beam under an incidence angle of 20° (twice the critical angle for channelling; Robinson, 1981), without chemistry assistance, those copper grains that exhibit strong channelling (and therefore slow etching) under normal bombardment are etched faster under off‐normal bombardment (Fig. 9).…”
Section: Improved Etch Selectivity Of Low‐k Coppermentioning
confidence: 99%