Fluorescence microscopy plays an important role in biomedical imaging because of its high sensitivity and specificity. However, the resolution of traditional fluorescence microscopy is limited due to the optical diffraction. Various techniques have been developed to surpass the diffraction limit in recent years. Among these existing methods, nonlinear structured illumination microscopy (SIM) simultaneously provides the ability of fast i m a g i n g s p e e d , w i d e f i e l d o f v i e w a n d e x t e n d e d r e s o l u t i o n improvement. However, the current developed nonlinear SIM approaches such as Saturated SIM and Photoswitching SIM have their own defects due to the strong photon bleaching and slow photoswitching speed respectively. We report a new nonlinear SIM technique based on stimulated emission depletion (STED), the illumination pattern of which combining both structured excitation field and structured STED field (SSTED-SIM). Theoretical study and simulation analysis have been conducted to demonstrate that SSTED-SIM performs better than other existing nonlinear SIM.