Theoretical model for phase conjugation of optical near fields

Bozhevolnyi, Sergey I.; Bozhevolnaya, Elena; Berntsen, Svend

doi:10.1364/josaa.12.002645

Cited by 22 publications

(17 citation statements)

References 20 publications

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“…The reconstructed image of the object was obtained by probing the phase-conjugated retrieved field with a fiber tip scanned along the surface of the hologram. (The phase-conjugated near-field has been theoretically formulated 10,11) and already been observed experimentally. 9) ) However, their method has difficulty in using common rectangular-parallelepiped or cubic crystals which are commercially available and widely used in conventional hologram experiments, and needs an angled (specially cut) metal(mirror)-deposited one.…”

Section: Near-field Hologrammentioning

confidence: 99%

Holographic Approach to Record and Retrieve Subwavelength-Size Objects Using Optical Near-Field

Kim

Lee

2001

Jpn. J. Appl. Phys.

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A holographic method for the storage and retrieval of subwavelength-size objects using optical near-field is proposed. Experimental results show that evanescent field components can be recorded and retrieved by our method and hence, an object whose size is smaller than the Rayleigh limit can be reconstructed. It may be an effective way of microhologram and suggests applications in biology and high-density optical memory systems.

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Section: Near-field Hologrammentioning

confidence: 99%

Holographic Approach to Record and Retrieve Subwavelength-Size Objects Using Optical Near-Field

Kim

Lee

2001

Jpn. J. Appl. Phys.

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“…(1994), Garcia & Nieto‐Vesperinas (1995). A discussion of the existence of the linear transfer in STOM/PSTM (photon scanning tunnelling microscopy) configuration as a function of size of the tip and of the tip‐to sample distance can be found in Bozhevolnyi et al . (1995, 1996).…”

Section: The Problem Of Resolution In Near‐field Microscopiesmentioning

confidence: 99%

“…Theoretical principles of superresolution of the various experimental set-ups can be found in Vigoureux et al (1989), van Labeke & Barchiesi (1992); Vigoureux & Courjon (1992), Girard et al (1994), Garcia & Nieto-Vesperinas (1995). A discussion of the existence of the linear transfer in STOM/PSTM (photon scanning tunnelling microscopy) configuration as a function of size of the tip and of the tip-to sample distance can be found in Bozhevolnyi et al (1995Bozhevolnyi et al ( , 1996. A survey of the solutions and of the problems can be found in Greffet & Carminati (1998).…”

Section: The Problem Of Resolution In Near-field Microscopiesmentioning

confidence: 99%

Characterization of reflection scanning near‐field optical microscopy and scanning tunnelling optical microscopy/photon scanning tunnelling microscopy working in preliminary approach constant height scanning mode

Barchiesi

1999

Journal of Microscopy

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The resolution in near-field images is currently determined by the visual inspection of recorded images. One of the major questions in near-field optical microscopy is 'what resolution can be reached, the tip-to-sample distance being known?' This knowledge is critical when choosing the scanning step and the distance between the tip and the sample, in a preliminary scan. This preliminary scan is often the only way to detect the interesting parts of the sample, with limited risk of tip crash and topographical artefacts. The method proposed here needs two scans of the same area, of the same sample, in constant height mode, recorded at two tip-to-sample distances. The pseudotransfer function is the ratio of the Fourier transform of these two data maps. This function enables the evaluation of the limit of resolution. Theoretical considerations are introduced to assess the method.

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“…22 Theoretically, the same kind of intensity distribution has been predicted by Bozhevolnyi et al in relation to phase conjugation of optical near fields. 23 It should be noted, that the radius of curvature of the probes, as measured with a scanning electron microscope, is at most 20 nm. After scanning, the probes were checked to confirm their shape had not changed.…”

Section: Optical Near-field Lithography On Hydrogen-passivated Silicomentioning

confidence: 99%

Optical near-field lithography on hydrogen-passivated silicon surfaces

Madsen

Müllenborn

Birkelund

et al. 1996

Applied Physics Letters

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We report on a novel lithography technique for patterning of hydrogen-passivated amorphous silicon surfaces. A reflection mode scanning near-field optical microscope with uncoated fiber probes has been used to locally oxidize a thin amorphous silicon layer. Lines of 110 nm in width, induced by the optical near field, were observed after etching in potassium hydroxide. The uncoated fibers can also induce oxidation without light exposure, in a manner similar to an atomic force microscope, and linewidths of 50 nm have been achieved this way.

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Theoretical model for phase conjugation of optical near fields

Cited by 22 publications

References 20 publications

Holographic Approach to Record and Retrieve Subwavelength-Size Objects Using Optical Near-Field

Holographic Approach to Record and Retrieve Subwavelength-Size Objects Using Optical Near-Field

Characterization of reflection scanning near‐field optical microscopy and scanning tunnelling optical microscopy/photon scanning tunnelling microscopy working in preliminary approach constant height scanning mode

Optical near-field lithography on hydrogen-passivated silicon surfaces

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